High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon.
| Autor: | Hovorka, M.1 hovorka@isibrno.cz, Frank, L.1, Valdaitsev, D.2, Nepijko, S.A.2, Elmers, H.S.2, Schönhense, G.2 |
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| Zdroj: | Journal of Microscopy. Apr2008, Vol. 230 Issue 1, p42-47. 6p. 1 Color Photograph, 3 Black and White Photographs, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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