Interface structural defects and photoluminescence properties of epitaxial GaN and AlGaN/GaN layers grown on sapphire.

Autor: Klad'ko, V. P.1, Chornen’kii, S. V.1, Naumov, A. V.1 naumov@ifpht.kiev.ua, Komarov, A. V.2, Tacano, M.3, Sveshnikov, Yu. N.4, Vitusevich, S. A.1, Belyaev, A. E.1
Zdroj: Semiconductors. Sep2006, Vol. 40 Issue 9, p1060-1065. 6p. 2 Graphs.
Databáze: Academic Search Ultimate