An eigenvalue-based similarity measure and its application in defect detection
Autor: | Tsai, Du-Ming iedmtsai@saturn.yzu.edu.tw, Yang, Ron-Hwa1 |
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Zdroj: | Image & Vision Computing. Nov2005, Vol. 23 Issue 12, p1094-1101. 8p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |