A scanning deflectometry scheme for online defect detection and 3-D reconstruction of specular reflective materials.

Autor: Bazeille, Stephane1 (AUTHOR), Meguenani, Anis1 (AUTHOR), Tout, Karim1 (AUTHOR), Kohler, Sophie1 (AUTHOR), Jrad, Oumaima1 (AUTHOR), Chambard, Jean-Pierre2 (AUTHOR), Cudel, Christophe1 (AUTHOR) christophe.cudel@uha.fr
Zdroj: International Journal of Advanced Manufacturing Technology. Mar2024, Vol. 131 Issue 1, p245-259. 15p.
Databáze: Academic Search Ultimate
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