A Study of Complex Defect Formation in Silicon Doped With Nickel.

Autor: Nasriddinov, S. S.1 (AUTHOR) sfera3110@yandex.ru, Esbergenov, D. M.2 (AUTHOR)
Zdroj: Russian Physics Journal. Jan2023, Vol. 65 Issue 9, p1559-1563. 5p.
Databáze: Academic Search Ultimate