Noise as Diagnostic Tool for Quality and Reliability of MEMS.
| Autor: | Mohd-Yasin, Faisal1 (AUTHOR) f.mohd-yasin@griffith.edu.au, Nagel, David J.2 (AUTHOR) nagel@gwu.edu |
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| Zdroj: | Sensors (14248220). 2/15/2021, Vol. 21 Issue 4, p1-14. 14p. |
| Databáze: | Academic Search Ultimate |
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