Determination of Free Electron Density in Sequentially Doped InxGa1−xAs by Raman Spectroscopy.
| Autor: | Kort, Kenneth R., Hung, P.Y., Loh, Wei-Yip, Bersuker, Gennadi, Banerjee, Sarbajit |
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| Zdroj: | Applied Spectroscopy. Feb2015, Vol. 69 Issue 2, p239-242. 4p. |
| Databáze: | Academic Search Ultimate |
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