Zobrazeno 1 - 10
of 31 296
pro vyhledávání: '"x-ray optics"'
Autor:
Liu, Peifan1 (AUTHOR), Pradhan, Paresh1 (AUTHOR), Shi, Xianbo1 (AUTHOR), Shu, Deming1 (AUTHOR), Kauchha, Keshab1 (AUTHOR), Qiao, Zhi1 (AUTHOR), Tamasaku, Kenji2 (AUTHOR), Osaka, Taito2 (AUTHOR), Zhu, Diling3 (AUTHOR), Sato, Takahiro3 (AUTHOR), MacArthur, James3 (AUTHOR), Huang, XianRong1 (AUTHOR), Assoufid, Lahsen1 (AUTHOR), White, Marion1 (AUTHOR), Kim, Kwang-Je1 (AUTHOR), Shvyd'ko, Yuri1 (AUTHOR) shvydko@anl.gov
Publikováno v:
Journal of Synchrotron Radiation. Jul2024, Vol. 31 Issue 4, p751-762. 12p.
Autor:
Wittwer, Felix, Modregger, Peter
High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damaging or destroying them through radiation damage. In this work, we propos
Externí odkaz:
http://arxiv.org/abs/2409.00166
Autor:
Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang-Je Kim, Yuri Shvyd'ko
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 4, Pp 751-762 (2024)
A cavity-based X-ray free-electron laser (CBXFEL) is a possible future direction in the development of fully coherent X-ray sources. CBXFELs consist of a low-emittance electron source, a magnet system with several undulators and chicanes, and an X-ra
Externí odkaz:
https://doaj.org/article/38284ee4932e49e2bb3d091e178d840d