Zobrazeno 1 - 10
of 35
pro vyhledávání: '"waveguide characterization"'
Akademický článek
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Autor:
Xesús Prieto-Blanco, Jesús Linares
Publikováno v:
IEEE Photonics Journal, Vol 4, Iss 1, Pp 65-79 (2012)
A method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for $N$ modes, although for the sake of simplicity, only the tw
Externí odkaz:
https://doaj.org/article/120c769bba164179b1d23d0cf6898731
Autor:
X. Prieto-Blanco, J. Linares
Publikováno v:
IEEE Photonics Journal, Vol 4, Iss 1, Pp 65-79 (2012)
A method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for $N$ modes, although for the sake of simplicity, only the tw
Conference
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Publikováno v:
Politecnico di Milano-IRIS
Optics communications
193 (2001): 141–146. doi:10.1016/S0030-4018(01)01254-8
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R/titolo:Ordinary and extraordinary refractive index profile characterization of single-mode proton-exchanged waveguides/doi:10.1016%2FS0030-4018(01)01254-8/rivista:Optics communications (Print)/anno:2001/pagina_da:141/pagina_a:146/intervallo_pagine:141–146/volume:193
Optics communications
193 (2001): 141–146. doi:10.1016/S0030-4018(01)01254-8
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R/titolo:Ordinary and extraordinary refractive index profile characterization of single-mode proton-exchanged waveguides/doi:10.1016%2FS0030-4018(01)01254-8/rivista:Optics communications (Print)/anno:2001/pagina_da:141/pagina_a:146/intervallo_pagine:141–146/volume:193
A new method allowing the characterization of both the ordinary and extraordinary refractive index profiles of single-mode proton-exchanged waveguides is presented and discussed. The method requires both TE and TM radiation modes to be prism coupled
Publikováno v:
Scopus-Elsevier
Optics communications
159 (1999): 37–42. doi:10.1016/S0030-4018(98)00580-X
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R and Russo, V/titolo:Nonconventional characterization of single-mode planar proton-exchanged LiNbO3 waveguides by Cherenkov second harmonic generation/doi:10.1016%2FS0030-4018(98)00580-X/rivista:Optics communications (Print)/anno:1999/pagina_da:37/pagina_a:42/intervallo_pagine:37–42/volume:159
Optics communications
159 (1999): 37–42. doi:10.1016/S0030-4018(98)00580-X
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R and Russo, V/titolo:Nonconventional characterization of single-mode planar proton-exchanged LiNbO3 waveguides by Cherenkov second harmonic generation/doi:10.1016%2FS0030-4018(98)00580-X/rivista:Optics communications (Print)/anno:1999/pagina_da:37/pagina_a:42/intervallo_pagine:37–42/volume:159
A nonconventional characterization method for single-mode planar proton-exchanged (PE) LiNbO3 waveguides is presented. The method exploits the dependence of the output angle of Cherenkov second-harmonic radiation-mode on the boundary conditions of th
Autor:
S. Sebastiani, Stefano Pelli, Simone Berneschi, G. Nunzi Conti, Giancarlo C. Righini, Massimo Brenci
Publikováno v:
Optical engineering (Bellingham, Print) 44(5) (2005): 54602-–54602-. doi:10.1117/1.1914802
info:cnr-pdr/source/autori:S. Sebastiani, S. Berneschi, M. Brenci, G. Nunzi Conti, S. Pelli, G. C. Righini/titolo:Simple approach to calculate the refractive index profile of ion-exchanged waveguides/doi:10.1117%2F1.1914802/rivista:Optical engineering (Bellingham, Print)/anno:2005/pagina_da:54602-/pagina_a:54602-/intervallo_pagine:54602-–54602-/volume:44(5)
info:cnr-pdr/source/autori:S. Sebastiani, S. Berneschi, M. Brenci, G. Nunzi Conti, S. Pelli, G. C. Righini/titolo:Simple approach to calculate the refractive index profile of ion-exchanged waveguides/doi:10.1117%2F1.1914802/rivista:Optical engineering (Bellingham, Print)/anno:2005/pagina_da:54602-/pagina_a:54602-/intervallo_pagine:54602-–54602-/volume:44(5)
In graded-index glass waveguides a key factor for the design of components and devices is usually the accurate determination of the refractive index profile as a function of depth. The problem of reconstructing the index profile using the measured ef
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54c4e9f7688b21b2214adf8b435ceb88
https://publications.cnr.it/doc/22632
https://publications.cnr.it/doc/22632
Autor:
Blaize, Sylvain, Aubert, Sebastien, Bruyant, Aurélien, Bachelot, Renaud, Lerondel, Gilles, Royer, Pascal, Minier, V., Broquin, J.-E.
Publikováno v:
Journal of Microscopy
Journal of Microscopy, Wiley, 2003, 209 (3), pp.155-161. ⟨10.1046/j.1365-2818.2003.01106.x⟩
Journal of Microscopy, 2003, 209 (3), pp.155-161. ⟨10.1046/j.1365-2818.2003.01106.x⟩
Journal of Microscopy, Wiley, 2003, 209 (3), pp.155-161. ⟨10.1046/j.1365-2818.2003.01106.x⟩
Journal of Microscopy, 2003, 209 (3), pp.155-161. ⟨10.1046/j.1365-2818.2003.01106.x⟩
International audience; We report the characterization of an integrated Ag+/Na+ ion exchange waveguide realized in a silicate glass substrate using apertureless scanning near‐field optical microscopy. Our experimental set‐up is based on the combi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e0a36e6f7515db5104d5f71ddd383e49
https://hal-utt.archives-ouvertes.fr/hal-02292911
https://hal-utt.archives-ouvertes.fr/hal-02292911
Publikováno v:
Scopus-Elsevier
Conference on Integrated Optics Devices III, pp. 271–278, 1999
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R/congresso_nome:Conference on Integrated Optics Devices III/congresso_luogo:/congresso_data:1999/anno:1999/pagina_da:271/pagina_a:278/intervallo_pagine:271–278
Conference on Integrated Optics Devices III, pp. 271–278, 1999
info:cnr-pdr/source/autori:Ramponi, R and Marangoni, M and Osellame, R/congresso_nome:Conference on Integrated Optics Devices III/congresso_luogo:/congresso_data:1999/anno:1999/pagina_da:271/pagina_a:278/intervallo_pagine:271–278
A non conventional method is presented for the determination of the refractive-index profile parameters (index change (Delta) n and optical depth d) of single-mode second-order nonlinear planar waveguides, exploiting second harmonic generation in the
Kniha
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