Zobrazeno 1 - 4
of 4
pro vyhledávání: '"van der Burgt JS"'
Autor:
Meng W; CAS Key Laboratory of Bio-inspired Materials and Interfaces Sciences, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China.; Center of Material Science and Optoelectronics Engineering, School of Future Technologies, University of Chinese Academy of Sciences, Beijing, 101407, China., Kragt AJJ; Department of Architecture and the Built Environment, Delft University of Technology, Julianalaan 134, Delft, 2628 BL, The Netherlands.; ClimAd Technology, Valkenaerhof 68, Nijmegen, 6538 TE, The Netherlands., Gao Y; CAS Key Laboratory of Bio-inspired Materials and Interfaces Sciences, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China.; Center of Material Science and Optoelectronics Engineering, School of Future Technologies, University of Chinese Academy of Sciences, Beijing, 101407, China., Brembilla E; Department of Architecture and the Built Environment, Delft University of Technology, Julianalaan 134, Delft, 2628 BL, The Netherlands., Hu X; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China., van der Burgt JS; ClimAd Technology, Valkenaerhof 68, Nijmegen, 6538 TE, The Netherlands., Schenning APHJ; Laboratory of Stimuli-Responsive Functional Materials & Devices, Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, P.O. Box 513, Eindhoven, 5600 MB, The Netherlands., Klein T; Department of Architecture and the Built Environment, Delft University of Technology, Julianalaan 134, Delft, 2628 BL, The Netherlands., Zhou G; Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China.; ClimAd Technology, Valkenaerhof 68, Nijmegen, 6538 TE, The Netherlands., van den Ham ER; Department of Architecture and the Built Environment, Delft University of Technology, Julianalaan 134, Delft, 2628 BL, The Netherlands., Tan L; CAS Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China., Li L; CAS Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China., Wang J; CAS Key Laboratory of Bio-inspired Materials and Interfaces Sciences, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China.; Center of Material Science and Optoelectronics Engineering, School of Future Technologies, University of Chinese Academy of Sciences, Beijing, 101407, China.; Binzhou Institute of Technology, Weiqiao-UCAS Science and Technology Park, Bingzhou, Shandong, 256606, China., Jiang L; CAS Key Laboratory of Bio-inspired Materials and Interfaces Sciences, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing, 100190, China.; Binzhou Institute of Technology, Weiqiao-UCAS Science and Technology Park, Bingzhou, Shandong, 256606, China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Feb; Vol. 36 (5), pp. e2304910. Date of Electronic Publication: 2023 Dec 05.
Autor:
van der Burgt JS; Center for Nanophotonics, NWO-Institute AMOLF, Science Park 104, 1098XG Amsterdam, The Netherlands., Needell DR; Department of Applied Physics and Materials Science, California Institute of Technology, Pasadena, California 91125, United States., Veeken T; Center for Nanophotonics, NWO-Institute AMOLF, Science Park 104, 1098XG Amsterdam, The Netherlands., Polman A; Center for Nanophotonics, NWO-Institute AMOLF, Science Park 104, 1098XG Amsterdam, The Netherlands., Garnett EC; Center for Nanophotonics, NWO-Institute AMOLF, Science Park 104, 1098XG Amsterdam, The Netherlands., Atwater HA; Department of Applied Physics and Materials Science, California Institute of Technology, Pasadena, California 91125, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2021 Sep 01; Vol. 13 (34), pp. 40742-40753. Date of Electronic Publication: 2021 Aug 19.
Autor:
van der Burgt JS; AMOLF Institute, 1098XG, Amsterdam, The Netherlands., Dieleman CD; AMOLF Institute, 1098XG, Amsterdam, The Netherlands.; Advanced Reseach Center for Nanolithography, 1098XG, Amsterdam, The Netherlands., Johlin E; Nanophotonic Energy Materials, Western Engineering, Western University, SEB 3094, London, Canada., Geuchies JJ; Optoelectronic Materials, Faculty of Applied Sciences, Delft University of Technology, 2629HZ, Delft, The Netherlands., Houtepen AJ; Optoelectronic Materials, Faculty of Applied Sciences, Delft University of Technology, 2629HZ, Delft, The Netherlands., Ehrler B; AMOLF Institute, 1098XG, Amsterdam, The Netherlands., Garnett EC; AMOLF Institute, 1098XG, Amsterdam, The Netherlands.
Publikováno v:
ACS photonics [ACS Photonics] 2021 Apr 21; Vol. 8 (4), pp. 1143-1151. Date of Electronic Publication: 2021 Apr 09.
Autor:
van der Burgt JS; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., Geuchies JJ; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., van der Meer B; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., Vanrompay H; Electron Microscopy for Materials Science, University of Antwerp, Antwerp 2000, Belgium., Zanaga D; Electron Microscopy for Materials Science, University of Antwerp, Antwerp 2000, Belgium., Zhang Y; Electron Microscopy for Materials Science, University of Antwerp, Antwerp 2000, Belgium., Albrecht W; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., Petukhov AV; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands.; Laboratory of Physical Chemistry, Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, Eindhoven 5612 AZ, Netherlands., Filion L; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., Bals S; Electron Microscopy for Materials Science, University of Antwerp, Antwerp 2000, Belgium., Swart I; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands., Vanmaekelbergh D; Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Soft Condensed Matter, Debye Institute for Nanomaterials Science, and Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3508 TA, Netherlands.
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2018 Jul 12; Vol. 122 (27), pp. 15706-15712. Date of Electronic Publication: 2018 Jun 14.