Zobrazeno 1 - 10
of 134
pro vyhledávání: '"van Waeyenberge, Bartel"'
Autor:
Moreels, Lars, Lateur, Ian, De Gusem, Diego, Mulkers, Jeroen, Maes, Jonathan, Milosevic, Milorad V., Leliaert, Jonathan, Van Waeyenberge, Bartel
o address the challenges posed by current magnetism research into systems with complex magnetic ordering and interfaces, we developed mumax+, an extensible GPU-accelerated micromagnetic simulator with a Python user interface. It is a general solver f
Externí odkaz:
http://arxiv.org/abs/2411.18194
Autor:
Maes, Jonathan, De Gusem, Diego, Lateur, Ian, Leliaert, Jonathan, Kurenkov, Aleksandr, Van Waeyenberge, Bartel
We present Hotspice, a Monte Carlo simulation software designed to capture the dynamics and equilibrium states of Artificial Spin Ice (ASI) systems with both in-plane (IP) and out-of-plane (OOP) geometries. An Ising-like model is used where each nano
Externí odkaz:
http://arxiv.org/abs/2409.05580
Autor:
Kurenkov, Aleksandr, Maes, Jonathan, Pac, Aleksandra, Macauley, Gavin Martin, Van Waeyenberge, Bartel, Hrabec, Aleš, Heyderman, Laura Jane
Arrays of coupled nanomagnets have wide-ranging fundamental and practical applications in artificial spin ices, neuromorphic computing and spintronics. However, lacking in these fields are nanomagnets with perpendicular magnetic anisotropy with suffi
Externí odkaz:
http://arxiv.org/abs/2408.12182
Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the s
Externí odkaz:
http://arxiv.org/abs/2407.10348
In semiconductor manufacturing, lithography has often been the manufacturing step defining the smallest possible pattern dimensions. In recent years, progress has been made towards high-NA (Numerical Aperture) EUVL (Extreme-Ultraviolet-Lithography) p
Externí odkaz:
http://arxiv.org/abs/2311.11439
Autor:
De Ridder, Vic, Dey, Bappaditya, Dehaerne, Enrique, Halder, Sandip, De Gendt, Stefan, Van Waeyenberge, Bartel
Continual shrinking of pattern dimensions in the semiconductor domain is making it increasingly difficult to inspect defects due to factors such as the presence of stochastic noise and the dynamic behavior of defect patterns and types. Conventional r
Externí odkaz:
http://arxiv.org/abs/2308.07180
With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges in advanced
Externí odkaz:
http://arxiv.org/abs/2307.08693
Autor:
Menezes, Raí M., Mulkers, Jeroen, Silva, Clécio C. de Souza, Van Waeyenberge, Bartel, Milošević, Milorad V.
Spin-waves (magnons) are among the prime candidates for building fast yet energy-efficient platforms for information transport and computing. We here demonstrate theoretically and in state-of-the-art micromagnetic simulation the effects that strategi
Externí odkaz:
http://arxiv.org/abs/2301.04922
Autor:
Everaert, Katrijn, Sander, Tilmann, Körber, Rainer, Loewa, Norbert, Van Waeyenberge, Bartel, Leliaert, Jonathan, Wiekhorst, Frank
Many characterization techniques for magnetic nanoparticles depend on the usage of external fields. This is not the case in Thermal Noise Magnetometry (TNM), where thermal fluctuations in the magnetic signal of magnetic nanoparticle ensembles are mea
Externí odkaz:
http://arxiv.org/abs/2209.15360
The development of future spintronic applications requires a thorough and fundamental understanding of the magnetisation dynamics. Of particular interest are magnetic nanodisks, in which the vortex state emerges as a stable spin configuration. Here,
Externí odkaz:
http://arxiv.org/abs/2112.08031