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of 156
pro vyhledávání: '"van Soestbergen, M."'
Publikováno v:
In Microelectronics Reliability November 2024 162
Autor:
Thukral, V., Roucou, R., Chou, C., Zaal, J.J.M., van Soestbergen, M., Rongen, R.T.H., van Driel, W.D., Zhang, G.Q.
Publikováno v:
In Microelectronics Reliability August 2024 159
Publikováno v:
In Microelectronics Reliability June 2024 157
Autor:
Thukral, V., van Soestbergen, M., Zaal, J.J.M., Roucou, R., Rongen, R.T.H., Driel, W.D.v, Zhang, G.Q.
Publikováno v:
In Microelectronics Reliability December 2022 139
Autor:
Herrmann, A., van Soestbergen, M., Erich, S.J.F., van der Ven, L.G.J., Huinink, H.P., van Driel, W.D., Mavinkurve, A., De Buyl, F., Adan, O.C.G.
Publikováno v:
In Microelectronics Reliability September 2022 136
Autor:
Herrmann, A., Erich, S.J.F., van der Ven, L.G.J., Huinink, H.P., van Driel, W.D., van Soestbergen, M., Mavinkurve, A., De Buyl, F., Fischer, H.R., Mol, J.M.C., Adan, O.C.G.
Publikováno v:
In Microelectronics Reliability July 2022 134
Publikováno v:
In Microelectronics Reliability May 2021 120
Autor:
Herrmann, A., Erich, S.J.F., Ven, L.G.J.v.d., Huinink, H.P., van Driel, W.D., van Soestbergen, M., Mavinkurve, A., De Buyl, F., Mol, J.M.C., Adan, O.C.G.
Publikováno v:
In Optical Materials: X May 2020 6
Publikováno v:
Phys Rev Lett 109, 108301 (2012)
Possible mechanisms for over-limiting current (OLC) through aqueous ion-exchange membranes (exceeding diffusion limitation) have been debated for half a century. Flows consistent with electro-osmotic instability (EOI) have recently been observed in m
Externí odkaz:
http://arxiv.org/abs/1202.6448
We present theoretical models for the time-dependent voltage of an electrochemical cell in response to a current step, including effects of diffuse charge (or "space charge") near the electrodes on Faradaic reaction kinetics. The full model is based
Externí odkaz:
http://arxiv.org/abs/0910.5357