Zobrazeno 1 - 4
of 4
pro vyhledávání: '"van Ninhuijs, Mark"'
Autor:
Platier, Bart, van de Wetering, Ferdi, van Ninhuijs, Mark, Brussaard, Seth, Banine, Vadim, Luiten, Jom, Beckers, Job
A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers, J., et al. "Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode micr
Externí odkaz:
http://arxiv.org/abs/2003.03279
Publikováno v:
Physical Review A, 106(6):063110. American Physical Society
We present microwave cavity resonance spectroscopy as a technique to determine excited-state photoionization cross sections of laser-cooled atoms. We demonstrate this technique by measuring the photoionization cross section of the 5 2P3/2(F′ = 4) e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::c0508ba82744103374963fa671f624e6
https://research.tue.nl/nl/publications/ddc6b9c4-c882-4c28-a8f3-a96d06ccdddd
https://research.tue.nl/nl/publications/ddc6b9c4-c882-4c28-a8f3-a96d06ccdddd
Autor:
Platier, Bart, van de Wetering, Ferdi, van Ninhuijs, Mark, Brussaard, Seth, Banine, Vadim, Luiten, Jom, Beckers, Job
A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers, J., et al. "Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7fc289eb880e7a31274238b26813ed59