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Autor:
Bosiers, Jan T., Kleimann, Agnes C., van Kuijk, Harry C., Le Cam, Laurent, Peek, Herman L., Maas, Joris P., Theuwissen, Albert J. P.
Publikováno v:
IEEE Transactions on Electron Devices; Mar2002, Vol. 49 Issue 3, p377, 10p, 4 Black and White Photographs, 10 Diagrams, 9 Charts, 4 Graphs
