Výsledky vyhledávání - "van Ek, J. A."

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Kinetic Monte Carlo Simulations of the Effect of the Exchange Control Layer Thickness in CoPtCrB/CoPtCrSiO Granular Media

Autor: Almudallal, Ahmad M., Mercer, J. I., Whitehead, J. P., Plumer, M. L., van Ek, J.

A hybrid kMC/LLG algorithm is used to simulate experimental MH hysteresis loops for dual layer ECC media. The calculation of the rate coefficients and difficulties arising from low energy barriers, a fundamental problem of the kMC method, are discuss

Externí odkaz: http://arxiv.org/abs/1703.07018

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Thermally activated switching at long time scales in exchange-coupled magnetic grains

Autor: Almudallal, Ahmad M., Mercer, J. I., Whitehead, J. P., Plumer, M. L., van Ek, J., Fal, T. J.

Rate coefficients of the Arrhenius-Neel form are calculated for thermally activated magnetic moment reversal for dual layer exchange-coupled composite (ECC) media based on the Langer formalism and are applied to study the sweep rate dependence of MH

Externí odkaz: http://arxiv.org/abs/1509.02047

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Micromagnetic simulations of sweep-rate dependent coercivity in perpendicular recording media

Autor: Plumer, M. L., Leblanc, M. D., Whitehead, J. P., van Ek, J.

The results of micromagnetic simulations are presented which examine the impact of thermal fluctuations on sweep rate dependent coercivities of both single-layer and exchange-coupled-composite (ECC) perpendicular magnetic recording media. M-H loops a

Externí odkaz: http://arxiv.org/abs/1203.3340

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New Paradigms in Magnetic Recording

Autor: Plumer, M. L., van Ek, J., Cain, W. C.

Publikováno v: Physics in Canada, vol. 67, page 25 (2011)

The magnetic hard disc drive industry continues to face serious challenges in its quest for ever decreasing bit size. This review summarizes recent advances and promising new technology which have foundations in fundamental physical principles. Some

Externí odkaz: http://arxiv.org/abs/1201.5543

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Resistivity due to low-symmetrical defects in metals

Autor: Dekker, J. P., Lodder, A., van Ek, J.

The impurity resistivity, also known as the residual resistivity, is calculated ab initio using multiple-scattering theory. The mean-free path is calculated by solving the Boltzmann equation iteratively. The resistivity due to low-symmetrical defects

Externí odkaz: http://arxiv.org/abs/cond-mat/9802285

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Theory for the electromigration wind force in dilute alloys

Autor: Dekker, J. P., Lodder, A., van Ek, J.

A multiple scattering formulation for the electromigration wind force on atoms in dilute alloys is developed. The theory describes electromigration via a vacancy mechanism. The method is used to calculate the wind valence for electromigration in vari

Externí odkaz: http://arxiv.org/abs/cond-mat/9710072

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