Zobrazeno 1 - 10
of 17
pro vyhledávání: '"van Eijk CW"'
Autor:
Maas MC; Delft University of Technology, Mekelweg 15, 2629 JB Delft, The Netherlands., van der Laan DJ, van Eijk CW, Schaart DR, Beekman FJ, Bruyndonckx P, Lemaître C
Publikováno v:
Medical physics [Med Phys] 2010 Apr; Vol. 37 (4), pp. 1904-13.
Autor:
Seravalli E; Delft University of Technology, Faculty of Applied Sciences, Delft, The Netherlands. e.seravalli@tudelft.nl, de Boer MR, Geurink F, Huizenga J, Kreuger R, Schippers JM, van Eijk CW
Publikováno v:
Physics in medicine and biology [Phys Med Biol] 2009 Jun 21; Vol. 54 (12), pp. 3755-71. Date of Electronic Publication: 2009 May 28.
Autor:
Maas MC; Delft University of Technology, Mekelweg 15, 2629 JB Delft, The Netherlands., Schaart DR, van der Laan DJ, Bruyndonckx P, Lemaître C, Beekman FJ, van Eijk CW
Publikováno v:
Physics in medicine and biology [Phys Med Biol] 2009 Apr 07; Vol. 54 (7), pp. 1893-908. Date of Electronic Publication: 2009 Mar 05.
Autor:
Seravalli E; Delft University of Technology, Faculty of Applied Sciences, Delft, The Netherlands. e.seravalli@tudelft.nl, de Boer MR, Geurink F, Huizenga J, Kreuger R, Schippers JM, van Eijk CW
Publikováno v:
Physics in medicine and biology [Phys Med Biol] 2008 Nov 07; Vol. 53 (21), pp. 6195-209. Date of Electronic Publication: 2008 Oct 14.
Autor:
Seravalli E; Foundation for Fundamental Research and Matter (FOM), Utrecht, The Netherlands. e.seravalli@tudelft.nl, de Boer M, Geurink F, Huizenga J, Kreuger R, Schippers JM, van Eijk CW, Voss B
Publikováno v:
Physics in medicine and biology [Phys Med Biol] 2008 Sep 07; Vol. 53 (17), pp. 4651-65. Date of Electronic Publication: 2008 Aug 11.
Autor:
van Eijk CW; Radiation Detection and Matter, R3, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB Delft, The Netherlands. c.w.e.vaneijk@tudelft.nl
Publikováno v:
Radiation protection dosimetry [Radiat Prot Dosimetry] 2008; Vol. 129 (1-3), pp. 13-21. Date of Electronic Publication: 2008 Mar 05.
Autor:
Birowosuto MD; Radiation Detection and Matter, Department of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB, Delft, The Netherlands., Dorenbos P, van Eijk CW, Krämer KW, Güdel HU
Publikováno v:
Journal of physics. Condensed matter : an Institute of Physics journal [J Phys Condens Matter] 2006 Jul 05; Vol. 18 (26), pp. 6133-48. Date of Electronic Publication: 2006 Jun 19.
Autor:
Bom VR; Delft University of Technology, Mekelweg 15, 2629 JB Delft, The Netherlands. vb@iri.tudelft.nl, van Eijk CW, Ali MA
Publikováno v:
Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine [Appl Radiat Isot] 2005 Nov-Dec; Vol. 63 (5-6), pp. 559-63. Date of Electronic Publication: 2005 Jul 18.
Autor:
Bom VR; Delft University of Technology, IRI, Mekelweg 15, Delft 2629 JB, The Netherlands. vb@iri.tudelft.nl, Datema CP, van Eijk CW
Publikováno v:
Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine [Appl Radiat Isot] 2004 Jul; Vol. 61 (1), pp. 21-5.
Autor:
Farahmand M; Delft University of Technology, IRI, 2629 JB Delft, The Netherlands. M.Farahmand@IRI.TUDELFT.NL, Bos AJ, De Nardo L, van Eijk CW
Publikováno v:
Radiation protection dosimetry [Radiat Prot Dosimetry] 2004; Vol. 110 (1-4), pp. 839-43.