Zobrazeno 1 - 10
of 1 148
pro vyhledávání: '"universal quality index"'
The depth of focus is a constraint of all the light microscopes, being not possible to acquire a single, completely in-focus, image of 3D objects characterized by a wide depth dimension. Since the seventies, many methods have been proposed to extend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4094::56b0c2ceb272282484d35937acbda25d
http://hdl.handle.net/11585/130212
http://hdl.handle.net/11585/130212
The depth of focus is a constraint of all the light microscopes, being not possible to acquire a single, completely in-focus, image of 3D objects characterized by a wide depth dimension. Since the Seventies, many methods have been proposed to extend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4094::a7925727298c223e30954ee1048720d4
http://hdl.handle.net/11585/133066
http://hdl.handle.net/11585/133066
Publikováno v:
Advances in Intelligent Systems and Computing ISBN: 9783319439815
MISSI
MISSI
In the article, the authors presented the possibilities of using the Universal Image Quality Index (Q)—a popular measure for evaluation of digital image quality in order to identify users based on analysing their fingerprints with the use of a refe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49fc2d4e534635b45ea148b36a24664c
https://doi.org/10.1007/978-3-319-43982-2_7
https://doi.org/10.1007/978-3-319-43982-2_7
Kniha
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Autor:
Aldo Morales, R.A. Mahoney
Publikováno v:
2007 Digest of Technical Papers International Conference on Consumer Electronics.
This paper expands new research in adaptive DCT quantization for images using perceptual distortion control and the newly defined universal quality index with the goal of reducing blocking artifacts at low bit-rates. Results obtained show that this m
Conference
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Conference
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Publikováno v:
Journal of Intelligent Systems, Vol 20, Iss 3, Pp 279-303 (2011)
Defect detection is a major concern in quality control of various products in industries. This paper presents two different machine-vision based methods for detecting defects on periodically patterned textures. In the first method, input defective im
Externí odkaz:
https://doaj.org/article/7bca53ed97bd44ca9aa9377bd2206df1
Publikováno v:
Journal of Digital Imaging; Aug2024, Vol. 37 Issue 4, p1991-2013, 23p
Autor:
Bhattacharjee, Brijit1 (AUTHOR), Debnath, Bikash2 (AUTHOR), Das, Jadav Chandra3 (AUTHOR), Kar, Subhashis1 (AUTHOR), Banerjee, Nandan4 (AUTHOR), Mallik, Saurav5,6 (AUTHOR) sauravmtech2@gmail.com, De, Debashis7 (AUTHOR)
Publikováno v:
Mathematics (2227-7390). Mar2023, Vol. 11 Issue 6, p1345. 19p.