Zobrazeno 1 - 10
of 1 295
pro vyhledávání: '"trajectory measurements"'
Autor:
王前东1 :wangqiandong@sohu.com
Publikováno v:
Telecommunication Engineering. 8/28/2024, Vol. 64 Issue 8, p1307-1314. 8p.
Autor:
Vindel-Zandbergen, Patricia1 (AUTHOR) patricia.vindel@nyu.edu, González-Vázquez, Jesús2,3 (AUTHOR)
Publikováno v:
Journal of Chemical Physics. 7/14/2024, Vol. 161 Issue 2, p1-11. 11p.
Autor:
Fan, Yue1,2 (AUTHOR), Wang, Huiwen1,3 (AUTHOR), Wang, Lihong4 (AUTHOR), Guo, Shu4 (AUTHOR) guoshu@cert.org.cn, Liu, Jing4 (AUTHOR)
Publikováno v:
Transactions in GIS. Dec2023, Vol. 27 Issue 8, p2320-2342. 23p.
Publikováno v:
Telecommunication Engineering. 8/28/2023, Vol. 63 Issue 8, p1180-1185. 6p.
Autor:
Kirwan, Emma M.1,2 (AUTHOR) emma.kirwan@ul.ie, Luchetti, Martina3 (AUTHOR), Burns, Annette4 (AUTHOR), O'Súilleabháin, Páraic S.1,2 (AUTHOR), Creaven, Ann‐Marie1,2 (AUTHOR)
Publikováno v:
British Journal of Developmental Psychology. Nov2024, p1. 15p. 1 Illustration.
Autor:
Kovalenko, Valentyn1 vsevolod.stryzhak@khpi.edu.ua, Kovalenko, Oleg1, Stryzhak, Vsevolod1, Stryzhak, Mariana1, Ruzmetov, Andrew1
Publikováno v:
International Journal of Mechatronics & Applied Mechanics. 2023, Issue 14, p248-256. 9p.
Autor:
Lunardelli, Abelardo Nunes1 (AUTHOR), Martins, Daniel Fernandes1 (AUTHOR), Lunardelli, Sandra Espíndola1 (AUTHOR), Martins, Luiz Gustavo Teixeira1 (AUTHOR), Salgado, Afonso Shiguemi Inoue2 (AUTHOR), Viseux, Frederic Jean François3,4 (AUTHOR), Schleip, Robert5,6 (AUTHOR), Traebert, Eliane1 (AUTHOR), Traebert, Jefferson1 (AUTHOR) jefferson.traebert@gmail.com
Publikováno v:
Dental Traumatology. Sep2024, p1. 10p. 2 Illustrations.
Autor:
ANDRAŞ, ANDREI1 fpopescu@gmail.com, POPESCU, FLORIN DUMITRU1 andrei.andras@gmail.com, MĂCEŞARU (LĂPĂDUŞI), IONELA CRISTINA2 cristinamacesaru@yahoo.com, BRÎNAŞ, ILDIKO3 kerteszildiko@ymail.com
Publikováno v:
Annals of the University of Petrosani Mechanical Engineering. 2023, Vol. 25, p17-32. 16p.
Publikováno v:
Telecommunication Engineering. 9/28/2022, Vol. 62 Issue 9, p1301-1308. 8p.
Publikováno v:
Electronic Science & Technology. 2022, Vol. 35 Issue 11, p72-79. 8p.