Výsledky vyhledávání - "timing degradation"

Cognitive approach to support dynamic aging compensation

Autor: David Meyer, Abhishek Jain, S. Mhira, Chittoor Parthasarathy, Vincent Huard, Florian Cacho, S. Naudet, Alain Bravaix, A. Benhassain

Publikováno v: ITC
2017 IEEE International Test Conference (ITC)
2017 IEEE International Test Conference (ITC), Oct 2017, Fort Worth, France. pp.1-7, ⟨10.1109/TEST.2017.8242042⟩

International audience; This paper shows new insights on the stochastic nature of aging-related timing impact in digital circuits. Varying critical paths through aging trigger the need for aging compensation control loop based on an unsupervised mach

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::186430ef751af03fadd84e856a878a7b
https://doi.org/10.1109/test.2017.8242042

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Dynamic aging compensation and Safety measures in Automotive environment

Autor: Chittoor Parthasarathy, S. Naudet, Alain Bravaix, Abhishek Jain, Florian Cacho, Vincent Huard, S. Mhira, A. Benhassain

Publikováno v: Psicologia: Teoria e Pesquisa
Psicologia: Teoria e Pesquisa, 2017, IEEE International Symposium on
Testing and Robust System Design (IOLTS), ⟨10.1109/IOLTS.2017.8046204⟩
IOLTS

International audience; New insights on the stochastic nature of aging-related timing impact in digital circuits trigger the need for aging compensation control loop. Such control loops enable additional 22% power savings but require dedicated safety

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b21e6f242882112236f5658ad0cb898
https://hal.science/hal-03654374

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Dynamic Adaptive Voltage Scaling in Automotive environment

Autor: Chittoor Parthasarathy, Abhishek Jain, S. Mhira, A. Benhassain, Vincent Huard, S. Naudet, Alain Bravaix, Florian Cacho

Publikováno v: 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017, Unknown, Unknown Region
2017 IEEE International Reliability Physics Symposium (IRPS)
2017 IEEE International Reliability Physics Symposium (IRPS), Apr 2017, Monterey, France. pp.3A-4.1-3A-4.7, ⟨10.1109/IRPS.2017.7936279⟩

IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, APR 02-06, 2017; International audience; A novel control loop enables Dynamic Adaptive Voltage Scaling in a demonstrator with digital cores tightly coupled with monitors and Dynam

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b0473b6bc0c0d11c3dbc4fcd9af71def
https://hal.archives-ouvertes.fr/hal-01694458

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On the Simulation of HCI-Induced Variations of IC Timings at High Level

Autor: François Marc, Nicolas Ventroux, Olivier Heron, Clément Bertolini, Chiara Sandionigi

Publikováno v: Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩

International audience; Die shrinking combined with the non-ideal scaling of voltage increases the probability of MOS transistors to encounter HCI. This mechanism causes timing degradation and possibly failures in ICs. The evaluation of timing degrad

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e6e006a73b1a42cdaf56b1bdb811a84
https://hal.archives-ouvertes.fr/hal-00950233

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