Zobrazeno 1 - 10
of 127 323
pro vyhledávání: '"thin‐film transistors"'
Autor:
Mattsson, Måns J., Niang, Kham M., Parker, Jared, Meeth, David J., Wager, John F., Flewitt, Andrew J., Graham, Matt W.
The complete subgap defect density of states (DoS) is measured using the ultrabroadband (0.15 to 3.5 eV) photoconduction response from p-type thin-film transistors (TFTs) of tin oxide, SnO, and copper oxide, Cu$_2$O. The TFT photoconduction spectra c
Externí odkaz:
http://arxiv.org/abs/2412.09533
Autor:
Tsai, Chia-Hung1,2 (AUTHOR) sppsai.ee12@nycu.edu.tw, Wu, Yang-En1 (AUTHOR) ivanwu.ee12@nycu.edu.tw, Kuo, Chuan-Wei3 (AUTHOR) bike615353@gmail.com, Chang, Ting-Chang4,5 (AUTHOR) tcchang3708@gmail.com, Chen, Li-Yin1 (AUTHOR) lychen@nycu.edu.tw, Chen, Fang-Chung1,6 (AUTHOR) fcchendop@nycu.edu.tw, Kuo, Hao-Chung1 (AUTHOR) fcchendop@nycu.edu.tw
Publikováno v:
Materials (1996-1944). Nov2024, Vol. 17 Issue 22, p5643. 13p.
Autor:
Park, So Hee1 (AUTHOR), Kim, Min Young1 (AUTHOR), Kim, Hyeong Wook1 (AUTHOR), Oh, Changyong1,2 (AUTHOR), Lee, Hyeong Keun3 (AUTHOR), Kim, Bo Sung1,2,3 (AUTHOR) bskim86@korea.ac.kr
Publikováno v:
Scientific Reports. 11/20/2023, Vol. 13 Issue 1, p1-9. 9p.
Autor:
Lee, Jiho1 (AUTHOR), Lee, Jae Hak2,3 (AUTHOR), Lee, Chan4 (AUTHOR), Lee, Haeyeon4 (AUTHOR), Jin, Minho2 (AUTHOR), Kim, Jiyeon1 (AUTHOR), Shin, Jong Chan4 (AUTHOR), Lee, Eungkyu5 (AUTHOR) eleest@khu.ac.kr, Kim, Youn Sang1,2,4,6,7 (AUTHOR) younskim@snu.ac.kr
Publikováno v:
Advanced Science. 12/27/2023, Vol. 10 Issue 36, p1-10. 10p.