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Publikováno v:
Computers & Electrical Engineering. 71:309-320
In this paper, we present a hybrid X-filling and two-stage test data compression (TS-TDC) techniques for digital VLSI circuits to reduce the test power and test data volume respectively. The proposed hybrid X-filling combines adjacent filling and mod
Publikováno v:
Kyungpook mathematical journal. 56:597-610
For a sufficiently adequate special case of the Dziok-Srivastava linear operator defined by means of the Hadamard product (or convolution) with Srivastava-Wright convolution operator, the authors investigate several mapping properties involving vario
Publikováno v:
Indian Journal of Science and Technology. 9
Objectives: A low-transition Test Pattern Generator (TPG) known as Bit Swapping LFSR (BS-LFSR) which generates the test vectors with low transitions. This will increase the correlation and results in one transition between the consecutive test patter
Publikováno v:
Scopus-Elsevier
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https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::01ae7a965d359ba1bf1b20b445043c10
http://www.scopus.com/inward/record.url?eid=2-s2.0-85058053456&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-85058053456&partnerID=MN8TOARS