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pro vyhledávání: '"synchronous in situ measurements"'
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Autor:
Xiaocheng Zhou, Xueping Liu, Xiaoqin Wang, Guojin He, Youshui Zhang, Guizhou Wang, Zhaoming Zhang
Publikováno v:
Remote Sensing, Vol 14, Iss 1, p 83 (2021)
Surface reflectance (SR) estimation is the most essential preprocessing step for multi-sensor remote sensing inversion of geophysical parameters. Therefore, accurate and stable atmospheric correction is particularly important, which is the premise an
Externí odkaz:
https://doaj.org/article/bd4246c382194f47b6e4b31cc8d7dacd
Autor:
Xiaocheng Zhou, Xueping Liu, Xiaoqin Wang, Guojin He, Youshui Zhang, Guizhou Wang, Zhaoming Zhang
Publikováno v:
Remote Sensing, Vol 14, Iss 83, p 83 (2022)
Remote Sensing; Volume 14; Issue 1; Pages: 83
Remote Sensing; Volume 14; Issue 1; Pages: 83
Surface reflectance (SR) estimation is the most essential preprocessing step for multi-sensor remote sensing inversion of geophysical parameters. Therefore, accurate and stable atmospheric correction is particularly important, which is the premise an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6eea2490579f30b6f8c33d87405a89f7
https://www.mdpi.com/2072-4292/14/1/83
https://www.mdpi.com/2072-4292/14/1/83
Publikováno v:
Journal of The Electrochemical Society; 2009, Vol. 156 Issue 10, pH794-H802, 9p
Autor:
and, Hooper
Publikováno v:
Journal of the Electrochemical Society; October 2009, Vol. 156 Issue: 10 pH794-H802, 9p
Autor:
Chris Rogers, James Vlahakis, Donald Hooper, Vincent P. Manno, Robert D. White, Mansour Moinpour, Sriram Anjur
Publikováno v:
Journal of The Electrochemical Society. 156:H794
Achieving device- and wafer-scale planarity in integrated circuit manufacturing is increasingly challenging as device sizes arereduced to 35 nm and smaller, and wafer sizes are increased from 300 to 450 mm. Hence a better understanding of chemicalmec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69b1862bd880dac284f8a09d641c1fe9
https://doi.org/10.1149/1.3205456
https://doi.org/10.1149/1.3205456
Autor:
Zhao, Hongkai1,2 (AUTHOR) zhaohongkai@zju.edu.cn, Zhou, Yudi1 (AUTHOR) zhouyudi@zju.edu.cn, Gu, Qiuling1 (AUTHOR) guqiuling@zju.edu.cn, Han, Yicai3 (AUTHOR) hanyicai@163.com, Wu, Hongda1 (AUTHOR) hongdawu94@zju.edu.cn, Xu, Peituo1 (AUTHOR) xupeituo@zju.edu.cn, Lin, Lei1 (AUTHOR) linlei@zju.edu.cn, Lv, Weige1 (AUTHOR) lvweige@zju.edu.cn, Wu, Lan1 (AUTHOR) wul@zju.edu.cn, Wu, Lingyun1 (AUTHOR) wlyun@zju.edu.cn, Jiang, Chengchong1 (AUTHOR) jiangchengchong@zju.edu.cn, Chen, Yang1 (AUTHOR) chenyang0914@zju.edu.cn, Yuan, Mingzhu1 (AUTHOR) mingzhu@zju.edu.cn, Sun, Wenbo4 (AUTHOR) haitianyise@donghailab.com, Liu, Chong1 (AUTHOR) chongliu@zju.edu.cn, Liu, Dong1,2 (AUTHOR) liudongopt@zju.edu.cn
Publikováno v:
Remote Sensing. Oct2024, Vol. 16 Issue 19, p3579. 17p.
Publikováno v:
International Journal of Remote Sensing; Feb2023, Vol. 44 Issue 4, p1254-1279, 26p
Publikováno v:
IEEE Transactions on Geoscience & Remote Sensing; Mar2013 Part 1, Vol. 51 Issue 3, p1383-1392, 10p
Autor:
Frey, Dmitry1,2 (AUTHOR) frey@ocean.ru, Osadchiev, Alexander1,3 (AUTHOR)
Publikováno v:
Remote Sensing. Dec2021, Vol. 13 Issue 24, p5014-N.PAG. 1p.