Zobrazeno 1 - 10
of 35 794
pro vyhledávání: '"super‐resolution imaging"'
Inverse synthetic aperture radar (ISAR) super-resolution imaging technology is widely applied in space target imaging. However, the performance limits of super-resolution imaging algorithms remain a rarely explored issue. This paper investigates thes
Externí odkaz:
http://arxiv.org/abs/2411.09155
The inherent non-linearity of intensity correlation functions can be used to spatially distinguish identical emitters beyond the diffraction limit, as achieved, for example, in Super-Resolution Optical Fluctuation Imaging (SOFI). Here, we propose a c
Externí odkaz:
http://arxiv.org/abs/2411.19369
In this paper, we present a unique multi-functional super-resolution instrument, the SuperNANO system, which integrates real-time super-resolution imaging with direct laser nanofabrication capabilities. Central to the func-tionality of the SuperNANO
Externí odkaz:
http://arxiv.org/abs/2408.08455
Autor:
Fusco, Denzel, Xypakis, Emmanouil, Gigante, Ylenia, Mautone, Lorenza, Di Angelantonio, Silvia, Ponsi, Giorgia, Ruocco, Giancarlo, Leonetti, Marco
In Super-resolution, a varying-illumination image stack is required. This enriched the dataset typically necessitates precise mechanical control and micron scale optical alignment and repeatability. Here, we introduce a novel methodology for super-re
Externí odkaz:
http://arxiv.org/abs/2409.16006
We consider an imaging system tasked with estimating the angular distance between two incoherently-emitting, identically bright, sub-Rayleigh-separated point sources, without any prior knowledge of the centroid or the constellation and with a fixed c
Externí odkaz:
http://arxiv.org/abs/2409.04323
Autor:
Jäckering, Lina, Wirth, Konstantin G., Conrads, Lukas, Profe, Jonas B., Rothstein, Alexander, Kyoseva, Hristiyana, Watanabe, Kenji, Taniguchi, Takashi, Kennes, Dante M., Stampfer, Christoph, Waldecker, Lutz, Taubner, Thomas
Encapsulating few-layer graphene (FLG) in hexagonal boron nitride (hBN) can cause nanoscale inhomogeneities in the FLG, including changes in stacking domains and topographic defects. Due to the diffraction limit, characterizing these inhomogeneities
Externí odkaz:
http://arxiv.org/abs/2407.04565