Zobrazeno 1 - 10
of 53
pro vyhledávání: '"stress-strength models"'
Publikováno v:
IEEE Transactions on Power Delivery. 36:1619-1630
Operating electrical networks by Dynamic Transformer Rating (DTR) unlocks the capacity of grids and allows to increase the exploitation of distributed generation and renewables. However, there is risk associated with the operation of transformers by
Akademický článek
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Autor:
Elio Chiodo, Giovanni Mazzanti
Publikováno v:
Electronics, Vol 10, Iss 2553, p 2553 (2021)
It is well known that, especially in the field of electronic components reliability studies and applications, the Exponential reliability model is by far the most adopted, although the data fostering it are few. This appears to be due partly to its s
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A key role for the reliability model identification of the electrical insulation of power system components is played by adequate ageing models. This is the case of the popular “Stress- Strength” models, where “Strength” is the electrical end
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0c30173fae4ee539805d5281d1cda530
http://hdl.handle.net/11588/729317
http://hdl.handle.net/11588/729317
Akademický článek
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Autor:
Pasquale De Falco, Elio Chiodo
A novel Inverse Burr stress-strength probabilistic model is proposed for reliability assessment of electrical components in the presence of overstresses, such as extreme wind-speed values for wind towers reliability modeling or extreme voltage surge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e82ce05fab4ea186a33aef3cbff553b1
http://hdl.handle.net/11367/83774
http://hdl.handle.net/11367/83774
Publikováno v:
International Journal of Engineering & Technology. 7:1072
This paper deals with the “physical reliability models” assessment and estimation for electrical insulation components. It is well known that the reliability model identification and estimation of most of the modern power system components, such
Autor:
CHIODO, ELIO, G. Mazzanti
Publikováno v:
IEEE Transactions on Dielectrics and Electrical Insulation. 13:146-159
Reliability assessment of aged electrical components in the presence of overstresses (e.g. voltage surges) is not an easy task. In this paper, a new methodology for solving this problem is illustrated, which is based on a Bayesian approach applied to