Zobrazeno 1 - 2
of 2
pro vyhledávání: '"small-signal device modeling"'
Publikováno v:
IEEE Access, Vol 6, Pp 43079-43087 (2018)
Available techniques for stability analysis of DC solutions, such as the popular Ohtomo test, make the task quite a straightforward one. Such tests are based on the assumption that the active subcircuit is inherently stable, which is reasonably easy
Externí odkaz:
https://doaj.org/article/6346f014d0d64bbfabd1c0756d898367
Publikováno v:
IEEE Access, Vol 6, Pp 43079-43087 (2018)
Available techniques for stability analysis of DC solutions, such as the popular Ohtomo test, make the task quite a straightforward one. Such tests are based on the assumption that the active subcircuit is inherently stable, which is reasonably easy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1119acd4ba23851aeea922974361ec53
http://hdl.handle.net/2108/202769
http://hdl.handle.net/2108/202769
