Výsledky vyhledávání - "scanning x-ray diffraction microscopy"

Akademický článek

High-speed free-run ptychography at the Australian Synchrotron

Autor: Michael W. M. Jones, Grant A. van Riessen, Nicholas W. Phillips, Christoph E. Schrank, Gerard N. Hinsley, Nader Afshar, Juliane Reinhardt, Martin D. de Jonge, Cameron M. Kewish

Publikováno v: Journal of Synchrotron Radiation, Vol 29, Iss 2, Pp 480-487 (2022)

Over the last decade ptychography has progressed rapidly from a specialist ultramicroscopy technique into a mature method accessible to non-expert users. However, to improve scientific value ptychography data must reconstruct reliably, with high imag

Externí odkaz: https://doaj.org/article/6cae4b595ac44e639bac2f82dbf266f8

Zobrazit plný text záznamu

Plný text ve formátu HTML

Akademický článek

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Akademický článek

Microdiffraction imaging—a suitable tool to characterize organic electronic devices

Autor: Clemens Liewald, Simon Noever, Stefan Fischer, Janina Roemer, Tobias U. Schülli, Bert Nickel

Publikováno v: AIMS Materials Science, Vol 2, Iss 4, Pp 369-378 (2015)

Tailoring device architecture and active film morphology is crucial for improving organic electronic devices. Therefore, knowledge about the local degree of crystallinity is indispensable to gain full control over device behavior and performance. In

Externí odkaz: https://doaj.org/article/3bdcbb7b29ad40b686d860243d3d238a

Zobrazit plný text záznamu

Akademický článek

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (epsilon(044)) and tilt of suspended monolithic silicon nanowire structures

Autor: Tobias U. Schülli, S. Dolabella, Ruggero Frison, Antonia Neels, C. Richter, B.E. Alaca, Alex Dommann, Gilbert André Chahine, Zuhal Tasdemir, Yusuf Leblebici

Publikováno v: Journal of Applied Crystallography
'Journal of Applied Crystallography ', vol: 53, pages: 58-68 (2020)

Silicon nanowire-based sensors find many applications in micro- and nano-electromechanical systems, thanks to their unique characteristics of flexibility and strength that emerge at the nanoscale. This work is the first study of this class of micro-

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1c3cd07854df92c625f9674dd8c8907c
http://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/8741

Zobrazit plný text záznamu

Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy

Autor: Enrico Salvati, Chrysanthi Papadaki, Tan Sui, Eric Le Bourhis, Igor P. Dolbnya, Hongjia Zhang, Siqi Ying, León Romano Brandt, Alexander M. Korsunsky

Publikováno v: Surface and Coatings Technology. 320:158-167

When thin metallic multilayers deposited on a compliant polymer substrate are subjected to stretching, a “brick wall” fracture pattern arises that is associated with a non-uniform two-dimensional stress-strain state evolving as a function of the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd3bbc88e6295cf80ed1a0bcd1c71b1b
https://doi.org/10.1016/j.surfcoat.2017.01.065

Zobrazit plný text záznamu

Real- and

Autor: Simone, Dolabella, Ruggero, Frison, Gilbert A, Chahine, Carsten, Richter, Tobias U, Schulli, Zuhal, Tasdemir, B Erdem, Alaca, Yusuf, Leblebici, Alex, Dommann, Antonia, Neels

Publikováno v: Journal of Applied Crystallography

A multiscale analytical approach is presented for understanding the structure of micro- and nano-fabricated nanowire-based sensors. Using scanning X-ray diffraction microscopy, crystal deformation is evaluated with respect to lattice strain and tilt

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::2975a0e5fcac4df170240fa3341ac7a3
https://pubmed.ncbi.nlm.nih.gov/32047404

Zobrazit plný text záznamu

Microdiffraction imaging—a suitable tool to characterize organic electronic devices

Autor: Stefan Fischer, Clemens Liewald, Tobias U. Schülli, Simon J. Noever, Bert Nickel, Janina Roemer

Publikováno v: AIMS Materials Science, Vol 2, Iss 4, Pp 369-378 (2015)
'AIMS Materials Science ', vol: 2, pages: 269-278 (2015)
AIMS Materials Science 2(4), 369-378 (2015). doi:10.3934/matersci.2015.4.369 special issue: "X-ray microscopy in Materials Sciences"

AIMS Materials Science 2(4), 369 - 378 (2015). doi:10.3934/matersci.2015.4.369 special issue: "X-ray microscopy in Materials Sciences"
Tailoring device architecture and active film morphology is crucial for improving organic electronic devices.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::664fe1a67a1b16f91137c1168ef18066
http://www.aimspress.com/Materials/article/459/fulltext.html

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání