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Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Autor: Florence Azaïs, François Lefèvre, T. Vayssade, Laurent Latorre

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2021, 40 (11), pp.2400-2410. ⟨10.1109/TCAD.2020.3043318⟩

International audience; Error Vector Magnitude (EVM) or alternately Offset Error Vector Magnitude (OEVM) is one of the most important performance to verify for RF circuits such as ZigBee transmitters in order to ensure that the quality of the generat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a3516f0524e5a145529f9d316bc38a5
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03426162/document

Digital test of ZigBee transmitters: Validation in industrial test environment

Autor: Thibault Vayssade, Florence Azaïs, François Lefèvre, L. Latorre

Publikováno v: DATE 2021-24th Design, Automation and Test in Europe Conference and Exhibition
DATE 2021-24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
Design, Automation & Test in Europe Conference & Exhibition (DATE 2021)
Design, Automation & Test in Europe Conference & Exhibition (DATE 2021), Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
DATE

International audience; This paper presents the validation of a low-cost solution for production test of ZigBee transmitters in industrial environment. The solution relies on 1-bit acquisition of a 2.4GHz signal with a standard digital ATE channel us

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5d2c7c9dd6179b8552a6edf884abcfca
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03426209

EVM measurement of RF ZigBee transceivers using standard digital ATE

Autor: Florence Azaïs, L. Latorre, François Lefèvre, T. Vayssade

Publikováno v: DFT 2020-33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
DFT 2020-33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩
DFT
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩

International audience; This paper targets the challenging issue of production test cost reduction for RF circuits. More specifically, it proposes a low-cost solution to perform EVM measurement of ZigBee transceivers using only a standard digital tes

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a570fcf7c2ea2f6daa6782753bb5b234
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03000882/document

An adaptive simulation framework for AMS-RF test quality

Autor: Gildas Leger, Valentin Gutierrez

Publikováno v: Digital.CSIC. Repositorio Institucional del CSIC
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Ensuring the quality of a circuit implies ensuring the quality of test. Despite the fact that performance-based testing has been the golden standard for Analog, Mixed-Signal and RF test for decades, high-reliability markets like automotive have found

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::35cadedda2ca075ffda3c8d0733c71fa
http://hdl.handle.net/10261/220439