Zobrazeno 1 - 7
of 7
pro vyhledávání: '"pseudo-ring testing"'
Publikováno v:
14 th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 13-15, 2011, Cottbus, Germany
Scan and ring schemes of the pseudo-ring memory selftesting are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-p
Externí odkaz:
http://arxiv.org/abs/1106.3677
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 3-9 (2018)
This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are
Externí odkaz:
https://doaj.org/article/88f4ae4c451c47f0b2ce5ed01f2c257e
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 3-9 (2018)
This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b8b3fbe124f44dc27ccbf37593731951
https://doi.org/10.15222/tkea2018.5-6.03
https://doi.org/10.15222/tkea2018.5-6.03
Publikováno v:
Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the propos
Externí odkaz:
http://arxiv.org/abs/0710.4657
Publikováno v:
Design, Automation & Test in Europe (9780769522883); 2005, p858-858, 1p
Autor:
Ghenadie Bodean, Wajeb Gharibi
Publikováno v:
International Journal of Distributed and Parallel systems. 3:23-30
In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0384d67feb1fad309122eb31767defb
https://doi.org/10.5121/ijdps.2012.3403
https://doi.org/10.5121/ijdps.2012.3403
Publikováno v:
DATE
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the propos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a9b03d3645ab69d120d7f2bc5a12c0fd
https://doi.org/10.1109/date.2005.223
https://doi.org/10.1109/date.2005.223