Conception and validation of a silicon 'patch-clamp chip' dedicated to parallelized and automated electrical measurements on individual living cells

Autor: Sordel, Thomas

Publikováno v: Autre [q-bio.OT]. Institut National Polytechnique de Grenoble-INPG, 2006. Français
Autre [q-bio.OT]. Institut National Polytechnique de Grenoble-INPG, 2006. Français. ⟨NNT : ⟩

Planar patch-clamp, a method to measure ionic currents by using on-planar substrate structured microholes, allows parallelizing measurements as needed by pharmaceutical companies. First, we have made a device allowing us to test our silicon chip and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6ce242c95d3d352b64e4475943846c18
https://tel.archives-ouvertes.fr/tel-00174805