Zobrazeno 1 - 1
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pro vyhledávání: '"opische dünne Schicht"'
For a variety of UV optical coatings, surface roughness was measured by use of an atomic-force-microscope (AFM) to study its dependence on the film material and thickness, coating design, and deposition process. After analyzing the corresponding powe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::c0b607c8ac602ba411fec7b78f3a39a5
https://publica.fraunhofer.de/handle/publica/192760
https://publica.fraunhofer.de/handle/publica/192760
