Výsledky vyhledávání

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

Autor: Arto Javanainen, C. Martinella, R. Gaillard, Roger Stark, Yacine Kadi, Maria Kastriotou, Carlo Cazzaniga, Andrea Coronetti, Ruben Garcia Alia, Ulrike Grossner

Publikováno v: IEEE Transactions on Nuclear Science, 68 (5)
IEEE Transactions on Nuclear Science

Accelerated terrestrial neutron irradiations were performed on different commercial SiC power MOSFETs with planar, trench and double-trench architectures. The results were used to calculate the failure cross-sections and the failure in time (FIT) rat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ee1e2df61ae728c8447cb3d13e32e93
https://doi.org/10.1109/tns.2021.3065122

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NEMESIS Setup for Indirect Detection of WIMPs

Autor: W.H. Trzaska, A. Barzilov, T. Enqvist, K. Jedrzejczak, J. Joutsenvaara, M. Kasztelan, O. Kotavaara, P. Kuusiniemi, K.K. Loo, J. Orzechowski, J. Puputti, M. Slupecki, J. Szabelski, I. Usoskin, T.E. Ward

We summarize the evidence for DM-like anomalies in neutron multiplicity spectra collected underground with Pb targets by three independent experiments: NEMESIS (at 210 m.w.e.) NMDS (at 583 m.w.e.), and ZEPLIN-II (at 2850 m.w.e.). A new analysis shows

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::763f5d4fe6400f483635c314aef85698
http://urn.fi/URN:NBN:fi:jyu-202208164111

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Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations

Autor: Giuseppe Lerner, Andrea Coronetti, Jean Mael Kempf, Ruben Garcia Alia, Francesco Cerutti, Daniel Prelipcean, Matteo Cecchetto, Antonio Gilardi, Wilfrid Farabolini, Roberto Corsini

Publikováno v: IEEE Transactions on Nuclear Science ( Early Access )

We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measure

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3b13538360917b4d9c756872e0c2dadf
http://cds.cern.ch/record/2823937

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Neutron-Induced Effects on a Self-Refresh DRAM

Autor: Manon Letiche, Alberto Bosio, Daniel Soderstrom, Lucas Matana Luza, Helmut Puchner, Ruben Garcia Alia, Luigi Dilillo, Carlo Cazzaniga

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩

International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-ref

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c90d78045df5b34043b806ac465a30ee
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435635/document

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First β-decay spectroscopy of $^{135}$In and new $β$-decay branches of $^{134}$In

Autor: Piersa-Siłkowska, M., Korgul, A., Benito, J., Fraile, L.M., Adamska, E., Andreyev, A.N., Álvarez-Rodríguez, R., Barzakh, A.E., Benzoni, G., Berry, T., Borge, M.J.G., Carmona, M., Chrysalidis, K., Correia, J.G., Costache, C., Cubiss, J.G., Day Goodacre, T., De Witte, H., Fedorov, D.V., Fedosseev, V.N., Fernández-Martínez, G., Fijałkowska, A., Fynbo, H., Galaviz, D., Galve, P., García-Díez, M., Greenlees, P.T., Grzywacz, R., Harkness-Brennan, L.J., Henrich, C., Huyse, M., Ibáñez, P., Illana, A., Janas, Z., Johnston, K., Jolie, J., Judson, D.S., Karanyonchev, V., Kicińska-Habior, M., Konki, J., Koszuk, Ł., Kurcewicz, J., Lazarus, I., Lică, R., López-Montes, A., Mach, H., Madurga, M., Marroquín, I., Marsh, B., Martínez, M.C., Mazzocchi, C., Miernik, K., Mihai, C., Mărginean, N., Mărginean, R., Negret, A., Nácher, E., Ojala, J., Olaizola, B., Page, R.D., Pakarinen, J., Pascu, S., Paulauskas, S.V., Perea, A., Pucknell, V., Rahkila, P., Raison, C., Rapisarda, E., Rezynkina, K., Rotaru, F., Rothe, S., Rykaczewski, K.P., Régis, J.-M., Schomacker, K., Siłkowski, M., Simpson, G., Sotty, C., Stan, L., Stănoiu, M., Stryjczyk, M., Sánchez-Parcerisa, D., Sánchez-Tembleque, V., Tengblad, O., Turturică, A., Udías, J.M., Van Duppen, P., Vedia, V., Villa, A., Viñals, S., Wadsworth, R., Walters, W.B., Warr, N., Wilkins, S.G.

Publikováno v: Physical Review C
Physical Review C, American Physical Society, 2021, 104 (4), pp.044328. ⟨10.1103/PhysRevC.104.044328⟩

International audience; The $\beta$ decay of the neutron-rich $^{134}$In and $^{135}$In was investigated experimentally in order to provide new insights into the nuclear structure of the tin isotopes with magic proton number $Z=50$ above the $N=82$ s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=arXiv_dedup_::ad848f40cdb64037eca9228812754b81
http://cds.cern.ch/record/2789022

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Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study

Autor: Carlo Cazzaniga, Eduardo Augusto Bezerra, Maria Kastriotou, Christian Poivey, Lucas Matana Luza, Daniel Soderstrom, Luigi Dilillo, Andre Martins Pio de Mattos

Publikováno v: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
DTIS
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

International audience; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7f28ed80a486f1971c2376760536693
http://urn.fi/URN:NBN:fi:jyu-202111015465

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