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pro vyhledávání: '"negative bias temperature instability (NBTI) variability"'
Publikováno v:
IndraStra Global.
A Monte Carlo SPICE framework is proposed to evaluate the impact of negative bias temperature instability (NBTI) variability on performance and static power (P-S) of static random access memory (SRAM) array on 14-nm node FinFETs. Gamma distribution i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=issn23813652::87a4b79ba1610697795b04e9ed1990c1
http://dspace.library.iitb.ac.in/xmlui/handle/100/22766
http://dspace.library.iitb.ac.in/xmlui/handle/100/22766
Akademický článek
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Autor:
Subrat Mishra, Yogesh Singh Chauhan, Narendra Parihar, Chetan Kumar Dabhi, Souvik Mahapatra, R Anandkrishnan
Publikováno v:
IEEE Transactions on Electron Devices. 65:4846-4853
A Monte Carlo SPICE framework is proposed to evaluate the impact of negative bias temperature instability (NBTI) variability on performance and static power ( ${P}_{\text {S}}$ ) of static random access memory (SRAM) array on 14-nm node FinFETs. Gamm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5aa31d7eba02dc8570aa6b347c73af19
https://doi.org/10.1109/ted.2018.2869669
https://doi.org/10.1109/ted.2018.2869669
Publikováno v:
IRPS
BSIM-CMG based HSPICE framework is developed for simulating time-zero and Negative Bias Temperature Instability (NBTI) variability of SRAM performance parameters. Time-zero variability of Read Static Noise Margin, Hold Static Noise Margin and Flip-Ti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a99a9a1367aea2813e65aa7480c6ab7
https://doi.org/10.1109/irps.2015.7112783
https://doi.org/10.1109/irps.2015.7112783
Publikováno v:
2015 IEEE International Reliability Physics Symposium; 2015, p00-CA.5.7, 0p