Zobrazeno 1 - 10
of 725
pro vyhledávání: '"near-field microwave microscopy"'
Publikováno v:
IEEE Journal of Microwaves, Vol 3, Iss 3, Pp 962-969 (2023)
Using near-field scanning microwave microscopy as a contact and non-contacting investigative tool for 3D surface metrology with three differing measurement modes, it has been possible to analyse structures that may be difficult for existing metrology
Externí odkaz:
https://doaj.org/article/088b57b28087416eae6f761b480a554f
Autor:
Joseph, C. H.1,2 (AUTHOR), Capoccia, Giovanni1 (AUTHOR), Lucibello, Andrea1 (AUTHOR), Proietti, Emanuela1 (AUTHOR), Sardi, Giovanni Maria1 (AUTHOR), Bartolucci, Giancarlo2 (AUTHOR), Marcelli, Romolo1 (AUTHOR) romolo.marcelli@cnr.it
Publikováno v:
Sensors (14248220). Mar2023, Vol. 23 Issue 6, p3360. 17p.
Akademický článek
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Autor:
Berweger, Samuel, Tyrell-Ead, Robert, Chang, Houchen, Wu, Mingzhong, Zhu, Na, Tang, Hong X., Nembach, Hans, Karl Stupic, T., Russek, Stephen, Mitch Wallis, T., Kabos, Pavel
Publikováno v:
In Journal of Magnetism and Magnetic Materials 15 March 2022 546
Autor:
C. H. Joseph, Giovanni Capoccia, Andrea Lucibello, Emanuela Proietti, Giovanni Maria Sardi, Giancarlo Bartolucci, Romolo Marcelli
Publikováno v:
Sensors, Vol 23, Iss 6, p 3360 (2023)
This work details an effective dynamic chemical etching technique to fabricate ultra-sharp tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part of the inner conductor in a commercial SMA (Sub Miniature A) coaxial c
Externí odkaz:
https://doaj.org/article/8e6fab9df2df4a37ab124b852a694383
Akademický článek
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Publikováno v:
Appl.Phys.Lett. 97, 183111 (2010)
Atomic resolution imaging is demonstrated using a hybrid scanning tunneling/near-field microwave microscope (microwave-STM). The microwave channels of the microscope correspond to the resonant frequency and quality factor of a coaxial microwave reson
Externí odkaz:
http://arxiv.org/abs/1007.0750
Autor:
Machida, Tadashi, Gaifullin, Marat B., Ooi, Shuuichi, Kato, Takuya, Sakata, Hideaki, Hirata, Kazuto
Publikováno v:
Applied Physics Express 2 (2009) 025006
We have designed and built a near-field scanning microwave microscope, which has been used to measure the local microwave response and the local density-of-states (LDOS) in the area including the boundary between the gold deposited and the non-deposi
Externí odkaz:
http://arxiv.org/abs/1003.5714
Publikováno v:
J. Appl. Phys. 97, 044302 (2005).
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays an import
Externí odkaz:
http://arxiv.org/abs/cond-mat/0408218
Publikováno v:
Microwave Superconductivity, edited by H. Weinstock and M. Nisenoff, (Kluwer, Amsterdam, 2001), pp. 239-269
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broa
Externí odkaz:
http://arxiv.org/abs/cond-mat/0001075