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Autor:
Sundh, Joacim
As electronics are getting both smaller and more advanced, the need to verify and validate remains and the means are getting more complex the more functions and components are added. Traditionally, in-circuit tests (ICTs) are performed by probing ded
Externí odkaz:
http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-319883
Autor:
Sundh, Joacim
As electronics are getting both smaller and more advanced, the need to verify and validate remains and the means are getting more complex the more functions and components are added. Traditionally, in-circuit tests (ICTs) are performed by probing ded
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______260::79df86f35f38d6e58f25493e6fdc75a5
http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-319883
http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-319883