Zobrazeno 1 - 10
of 24
pro vyhledávání: '"muistit"'
Publikováno v:
Valokynä. (3):8-11
Autor:
Auvinen, Eetu
The objective of this thesis was to improve upon the dynamic memory allocator used in U-Blox GNSS receivers. After initial analysis, the main weakness of the currently used Buddy allocator was determined to be high fragmentation, so lowering this was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4853::60f8139878c0861fc808a568f79526fd
https://trepo.tuni.fi/handle/10024/140229
https://trepo.tuni.fi/handle/10024/140229
Autor:
Carlo Cazzaniga, Eduardo Augusto Bezerra, Maria Kastriotou, Christian Poivey, Lucas Matana Luza, Daniel Soderstrom, Luigi Dilillo, Andre Martins Pio de Mattos
Publikováno v:
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
DTIS
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
DTIS
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DTIS 2021-16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
International audience; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7f28ed80a486f1971c2376760536693
http://urn.fi/URN:NBN:fi:jyu-202111015465
http://urn.fi/URN:NBN:fi:jyu-202111015465
Autor:
Arto Javanainen, Matteo Cecchetto, Andrea Coronetti, Frédéric Saigné, Ruben Garcia Alia, Maris Tali, Carlo Cazzaniga, Paul Leroux, Jialei Wang
Publikováno v:
IEEE Transactions on Nuclear Science
Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for state-of-the-art deep sub-mic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::630ddb920b0c5249d02c7e91415743db
http://urn.fi/URN:NBN:fi:jyu-202102261787
http://urn.fi/URN:NBN:fi:jyu-202102261787
Autor:
Mario Sacristan, Andrea Coronetti, Emil van der Graaf, Roberto Corsini, Antonio Gilardi, Miroslaw Marszalek, C. Frost, Carlo Cazzaniga, Athina Papadopoulou, Jialei Wang, Marc-Jan van Goethem, Wojtek Hajdas, Maris Tali, Anthony Dubois, Wilfrid Farabolini, Ruben Garcia Alia, Matteo Cecchetto, Arto Javanainen, Pablo Fernandez Martinez, Kacper Bilko, Laura Sinkunaite, Florent Castellani, Pedro Martin-Holgado, Jukka Jaatinen, Heikki Kettunen, Yolanda Morilla, Sytze Brandenburg, Giulia Bazzano, Mikko Rossi, Maria Kastriotou, Helmut Puchner, S. Fiore, Marie-Helene Moscatello, Manon Letiche, Harry Kiewiet
Publikováno v:
2020 IEEE Radiation Effects Data Workshop
2020 IEEE Radiation Effects Data Workshop, Dec 2020, Online, United States. ⟨10.1109/redw51883.2020.9325822⟩
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)
2020 IEEE Radiation Effects Data Workshop, REDW 2020-Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
2020 IEEE Radiation Effects Data Workshop, Dec 2020, Online, United States. pp.1-8, ⟨10.1109/redw51883.2020.9325822⟩
2020 IEEE Radiation Effects Data Workshop, Dec 2020, Online, United States. ⟨10.1109/redw51883.2020.9325822⟩
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)
2020 IEEE Radiation Effects Data Workshop, REDW 2020-Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
2020 IEEE Radiation Effects Data Workshop, Dec 2020, Online, United States. pp.1-8, ⟨10.1109/redw51883.2020.9325822⟩
International audience; The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8030bdc7e11f3b68e01d359a41beb72b
https://hal.archives-ouvertes.fr/hal-03346681
https://hal.archives-ouvertes.fr/hal-03346681
Autor:
Veronique Ferlet-Cavrois, Viyas Gupta, Heikki Kettunen, Georgios Tsiligiannis, Thierry Gil, Luigi Dilillo, Frédéric Wrobel, Ari Virtanen, Helmut Puchner, Alexandre Louis Bosser, Dale Brewe, Frédéric Saigné, Stephen LaLumondiere, Arto Javanainen
Publikováno v:
17th IEEE European Conference on Radiation and Its Effects on Components and Systems
RADECS: Radiation and Its Effects on Components and Systems
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
RADECS: Radiation and Its Effects on Components and Systems
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
International audience; This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate c
Publikováno v:
ICISSP
Reliable memory acquisition is essential to forensic analysis of a cyber-crime. Various methods of memory acquisition have been proposed, ranging from tools based on a dedicated hardware to software only solutions. Recently, a hypervisor-based method
Autor:
Bosser, Alexandre Louis
Electronic memories are ubiquitous components in electronic systems: they are used to store data, and can be found in all manner of industrial, automotive, aerospace, telecommunication and entertainment systems. Memory technology has seen a constant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1222::d8d6f69151102f1cdbe87fc9e8d3b082
http://urn.fi/URN:ISBN:978-951-39-7312-4
http://urn.fi/URN:ISBN:978-951-39-7312-4
Autor:
Bosser, Alexandre, Gupta, V., Javanainen, Arto, Tsiligiannis, G., LaLumondiere, S. D., Brewe, D., Ferlet-Cavrois, V., Puchner, H., Kettunen, Heikki, Gil, T., Wrobel, F., Saigné, F., Virtanen, Ari, Dilillo, L.
This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1222::a75c991768c004559274de76db05cc9c
http://urn.fi/URN:NBN:fi:jyu-201808203863
http://urn.fi/URN:NBN:fi:jyu-201808203863