Zobrazeno 1 - 1
of 1
pro vyhledávání: '"isometric feature mapping method of landmarks"'
Publikováno v:
Open Physics, Vol 21, Iss 1, Pp 042002-57 (2023)
To solve the problem of feature extraction in electronic circuits due to the nonstationary and nonlinear characteristics of fault signals, a fault feature extraction method for electronic circuits is proposed, which combines wavelet packet analysis a
Externí odkaz:
https://doaj.org/article/2a69bdcfce3046f480fd2ad0dc14d977
