Zobrazeno 1 - 10
of 126
pro vyhledávání: '"integrated memory circuits"'
Autor:
FAHEY, JONATHAN
Publikováno v:
Forbes. 4/30/2001, Vol. 167 Issue 10, p124-128. 3p.
Publikováno v:
Electronics Letters, Vol 60, Iss 14, Pp n/a-n/a (2024)
Abstract A 4‐tap time‐domain decision feedback equalizer (TD‐DFE) is presented to implement a multi‐tap DFE in a matched DQ (data)‐DQS (strobe) tree architecture. Traditionally, matched architecture holds an advantage in terms of power nois
Externí odkaz:
https://doaj.org/article/bbf309c105bc492f92a37c668c533fdf
Publikováno v:
Electronics Letters, Vol 60, Iss 8, Pp n/a-n/a (2024)
Abstract This work proposes a storage element (SE) design for in‐memory computing (IMC). Using the proposed SE design, an IMC array has been constructed to enable in‐situ updates of stored weights. Compared with some existing related works which
Externí odkaz:
https://doaj.org/article/2ace69fce89d4e09870a6000fc6f1bb5
Autor:
Kavitha, M.1 kavithaengr@gmail.com, Govindaraj, T.2
Publikováno v:
Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ). Aug2016, Vol. 41 Issue 8, p2945-2955. 11p.
Autor:
Martignani, Luca1
Publikováno v:
Monist. Apr2014, Vol. 97 Issue 2, p236-245. 10p.
Autor:
Franco, Francisco J.1, Clemente, Juan Antonio2, Baylac, Maud3, Rey, Solenne3, Villa, Francesca3, Mecha, Hortensia2, Agapito, Juan A.1, Puchner, Helmut4, Hubert, Guillaume5, Velazco, Raoul6
Publikováno v:
IEEE Transactions on Nuclear Science. Aug2017, Vol. 64 Issue 8 Part 1, p2152-2160. 9p.
Autor:
Secondo, R.1, Alia, R. Garcia1, Peronnard, P.1, Brugger, M.1, Masi, A.1, Danzeca, S.1, Merlenghi, A.1, Vaille, J. R.2, Dusseau, L.3
Publikováno v:
IEEE Transactions on Nuclear Science. Aug2017, Vol. 64 Issue 8 Part 1, p2107-2114. 8p.
Publikováno v:
Economist. 5/27/2023, Vol. 447 Issue 9348, p55-55. 1/2p.
Autor:
Limachia, Mitesh Jethabhai1,2,3 miteshjlimachia@rediffmail.com, Thakker, Rajesh A.1,2,3 rathakker2008@gmail.com, Kothari, Nikhil J.1,2,3 njkothari@gmail.com
Publikováno v:
Circuit World. 2018, Vol. 44 Issue 4, p187-194. 8p.
Autor:
Jin, Minjung1 minjung.jin@samsung.com, Kim, Kangjung1, Kim, Yoohwan1, Shim, Hyewon1, Kim, Jinju1, Kim, Gunrae1, Pae, Sangwoo1
Publikováno v:
Microelectronics Reliability. Feb2018, Vol. 81, p201-209. 9p.