Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES

Autor: Sven Tougaard, C. Zborowski

Publikováno v: Surface and Interface Analysis
Surface and Interface Analysis, 2019, 51 (8), pp.857-873. ⟨10.1002/sia.6660⟩
Zborowski, C & Tougaard, S M 2019, ' Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES ', Surface and Interface Analysis, vol. 51, no. 8, pp. 857-873 . https://doi.org/10.1002/sia.6660

International audience; The approach of inelastic background analysis was previously demonstrated to be a useful tool for retrieving the depth distribution of buried layers with an accuracy, which is better than 5% even for some complex samples. This

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::860cf036e42a56938448d11906016765
https://doi.org/10.1002/sia.6660

Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers

Autor: Risterucci, Paul, Renault, O., Zborowski, Charlotte, Bertrand, D., Torres, A., Rueff, J., Ceolin, D., Grenet, Geneviève, Schneider, C., Tougaard, S.

Publikováno v: Applied Surface Science
Applied Surface Science, 2017, 402, pp.78. ⟨10.1016/j.apsusc.2017.01.046⟩
Applied Surface Science, Elsevier, 2017, 402, pp.78. ⟨10.1016/j.apsusc.2017.01.046⟩
Risterucci, P, Renault, O, Zborowski, C, Bertrand, D, Torres, A, Rueff, J-P, Ceolin, D, Grenet, G & Tougaard, S M 2017, ' Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers ', Applied Surface Science, vol. 402, pp. 78-85 . https://doi.org/10.1016/j.apsusc.2017.01.046

International audience; Inelastic background analysis of HAXPES spectra was recently introduced as a powerful method to get access to the elemental distribution in deeply buried layers or interfaces, at depth up to 60 nm below the surface. However th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::275daf6726b2d2cd521f9b8235894ff3
https://doi.org/10.1016/j.apsusc.2017.01.046

Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample

Autor: C. Zborowski, Olivier Renault, Geneviève Grenet, Sven Tougaard, Yoshiyuki Yamashita, A. Torres

Publikováno v: Zborowski, C, Renault, O, Torres, A, Yamashita, Y, Grenet, G & Tougaard, S 2018, ' Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample ', Applied Surface Science, vol. 432, no. Part A, pp. 60-70 . https://doi.org/10.1016/j.apsusc.2017.06.081
Applied Surface Science
Applied Surface Science, Elsevier, 2018, 432, pp.60-70. ⟨10.1016/j.apsusc.2017.06.081⟩
Applied Surface Science, 2018, 432, pp.60-70. ⟨10.1016/j.apsusc.2017.06.081⟩

International audience; The recent progress in HAXPES combined with Inelastic Background Analysis makes this method a powerful, non-destructive solution to get quantitative information on deeply buried layers and interfaces at depths up to 70 nm. How

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef69d5a7c7968d4effaff89c986ee170
https://portal.findresearcher.sdu.dk/da/publications/dd3262f4-12e7-4c0f-b62a-1beea6e5030b

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Messung des 478 keV Gammaproduktionsquerschnitts nach inelastischer Streuung an ⁷ Li

Autor: Frotscher, Axel

Publikováno v: TU Dresden, 2017Mentor: Dr. Arnd Junghans

Der inelastische Streuquerschnitt von Neutronen mit 7Li weist keine scharfen Resonanzen und eine relativ niedrige Schwelle von 546 keV auf. Bis zur Aufbruchschwelle von 5291 keV findet die inelastische Streuung ausschließlich durch Emission eines �

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a5c23c06af7c1c9447a77f523d870717
https://www.hzdr.de/publications/Publ-27814-1