Zobrazeno 1 - 10
of 12
pro vyhledávání: '"hiukkassäteily"'
Autor:
P. A. Bernhardt, M. Hua, J. Bortnik, Q. Ma, P. T. Verronen, M. P. McCarthy, D. L. Hampton, M. Golkowski, M. B. Cohen, D. K. Richardson, A. D. Howarth, H. G. James, N. P. Meredith
Publikováno v:
Journal of geophysical research. Space physics, vol 127, iss 6
Ground-based very low frequency (VLF) transmitters located around the world generate signals that leak through the bottom side of the ionosphere in the form of whistler mode waves. Wave and particle measurements on satellites have observed that these
Autor:
Spyridon Korkos, Ville Jantunen, Kai Arstila, Timo Sajavaara, Aleksi Leino, Kai Nordlund, Flyura Djurabekova
Highly energetic ions have been previously used to modify the shape of metal nanoparticles embedded in an insulating matrix. In this work, we demonstrate that under suitable conditions, energetic ions can be used not only for shape modification but a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::65d134d2d71f71661fc704f6006f268a
http://hdl.handle.net/10138/347979
http://hdl.handle.net/10138/347979
Autor:
C. Ahdida, D. Bozzato, D. Calzolari, F. Cerutti, N. Charitonidis, A. Cimmino, A. Coronetti, G. L. D’Alessandro, A. Donadon Servelle, L. S. Esposito, R. Froeschl, R. García Alía, A. Gerbershagen, S. Gilardoni, D. Horváth, G. Hugo, A. Infantino, V. Kouskoura, A. Lechner, B. Lefebvre, G. Lerner, M. Magistris, A. Manousos, G. Moryc, F. Ogallar Ruiz, F. Pozzi, D. Prelipcean, S. Roesler, R. Rossi, M. Sabaté Gilarte, F. Salvat Pujol, P. Schoofs, V. Stránský, C. Theis, A. Tsinganis, R. Versaci, V. Vlachoudis, A. Waets, M. Widorski
Publikováno v:
Frontiers in Physics, 9, Art.-Nr.: 788253
Frontiers in Physics, Vol 9 (2022)
Digibug. Repositorio Institucional de la Universidad de Granada
Consorcio Madroño
Frontiers in Physics, Vol 9 (2022)
Digibug. Repositorio Institucional de la Universidad de Granada
Consorcio Madroño
We would like to deeply thank the CERN Knowledge Transfer and Legal Service teams for their essential and extended support. Our appreciation also goes to the FLUKA.CERN Collaboration Board members for their strong commitment.
FLUKA is a general
FLUKA is a general
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c936bad9c87f2150974c6fce959c3d5
https://publikationen.bibliothek.kit.edu/1000143501
https://publikationen.bibliothek.kit.edu/1000143501
Autor:
Manon Letiche, Alberto Bosio, Daniel Soderstrom, Lucas Matana Luza, Helmut Puchner, Ruben Garcia Alia, Luigi Dilillo, Carlo Cazzaniga
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Microelectronics Reliability, Elsevier, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-ref
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c90d78045df5b34043b806ac465a30ee
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435635/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435635/document
Autor:
Boscolo, Daria, Kostyleva, Daria, Safari, Mohammad Javad, Anagnostatou, Vasiliki, Äystö, Juha, Bagchi, Soumya, Binder, Tim, Dedes, Georgios, Dendooven, Peter, Dickel, Timo, Drozd, Vasyl, Franczack, Bernhard, Geissel, Hans, Gianoli, Chiara, Graeff, Christian, Grahn, Tuomas, Greiner, Florian, Haettner, Emma, Haghani, Roghieh, Harakeh, Muhsin N., Horst, Felix, Hornung, Christine, Hucka, Jan-Paul, Kalantar-Nayestanaki, Nasser, Kazantseva, Erika, Kindler, Birgit, Knöbel, Ronja, Kuzminchuk-Feuerstein, Natalia, Lommel, Bettina, Mukha, Ivan, Nociforo, Chiara, Ishikawa, Shunki, Lovatti, Giulio, Nitta, Munetaka, Ozoemelam, Ikechi, Pietri, Stephane, Plaß, Wolfgang R., Prochazka, Andrej, Purushothaman, Sivaji, Reidel, Claire-Anne, Roesch, Heidi, Schirru, Fabio, Schuy, Christoph, Sokol, Olga, Steinsberger, Timo, Tanaka, Yoshiki K., Tanihata, Isao, Thirolf, Peter, Tinganelli, Walter, Voss, Bernd, Weber, Uli, Weick, Helmut, Winfield, John S., Winkler, Martin, Zhao, Jianwei, Scheidenberger, Christoph, Parodi, Katia, Durante, Marco, Super-FRS Experiment Collaboration
Several techniques are under development for image-guidance in particle therapy. Positron (β+) emission tomography (PET) is in use since many years, because accelerated ions generate positron-emitting isotopes by nuclear fragmentation in the human b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1222::81bd4dcc32fec590c54f0969e299c141
http://urn.fi/URN:NBN:fi:jyu-202108234621
http://urn.fi/URN:NBN:fi:jyu-202108234621
Autor:
Andreou, Charalambos M., González-Castaño, Diego Miguel, Gerardin, Simone, Bagatin, Marta, Gómez Rodriguez, Faustino, Paccagnella, Alessandro, Prokofiev, Alexander V., Javanainen, Arto, Virtanen, Ari, Liberali, Valentino, Calligaro, Cristiano, Nahmad, Daniel, Georgiou, Julius
Publikováno v:
Electronics, Vol 8, Iss 5, p 562 (2019)
Electronics
Volume 8
Issue 5
Electronics
Volume 8
Issue 5
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under &gamma
rays,
rays,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::58340dd2b36aa00b524688407e0d6f1d
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-389867
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-389867
Autor:
Bosser, Alexandre Louis
Electronic memories are ubiquitous components in electronic systems: they are used to store data, and can be found in all manner of industrial, automotive, aerospace, telecommunication and entertainment systems. Memory technology has seen a constant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1222::d8d6f69151102f1cdbe87fc9e8d3b082
http://urn.fi/URN:ISBN:978-951-39-7312-4
http://urn.fi/URN:ISBN:978-951-39-7312-4
Autor:
Javanainen, Arto
The unavoidable presence of particle radiation in space and on the ground combined with constantly evolving technology necessitates a deep understanding of the basic mechanisms underlying radiation effects in materials and electronic devices. This th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1222::3164c228c4def559b2f4715218bc044d
http://urn.fi/URN:ISBN:978-951-39-4727-9
http://urn.fi/URN:ISBN:978-951-39-4727-9