Zobrazeno 1 - 10
of 501
pro vyhledávání: '"helium-ion microscopy"'
Publikováno v:
Plant Methods, Vol 19, Iss 1, Pp 1-15 (2023)
Abstract Background Investigations into the growth and self-organization of plant roots is subject to fundamental and applied research in various areas such as botany, agriculture, and soil science. The growth activity of the plant tissue can be inve
Externí odkaz:
https://doaj.org/article/d3e26def2514487db002e44b8d16741b
Autor:
Kun Li, Arjav Shah, Rajesh Kumar Sharma, Raymond Adkins, Tihomir Marjanovic, Patrick S. Doyle, Slaven Garaj
Publikováno v:
Advanced Materials Interfaces, Vol 10, Iss 33, Pp n/a-n/a (2023)
Abstract Viruses come in various shapes and sizes, and understanding their morphology is central to understanding their activity and function. The need for fast recognition and real‐time fingerprinting methods for pathogenic viruses is a critical b
Externí odkaz:
https://doaj.org/article/0fba09fe071d42b8a84bdf84c5537fd2
Autor:
Chun‐Ho Chuang, Ting‐Yun Wang, Chun‐Yi Chou, Sheng‐Han Yi, Yu‐Sen Jiang, Jing‐Jong Shyue, Miin‐Jang Chen
Publikováno v:
Advanced Science, Vol 10, Iss 32, Pp n/a-n/a (2023)
Abstract Atomic layer engineering is investigated to tailor the morphotropic phase boundary (MPB) between antiferroelectric, ferroelectric, and paraelectric phases. By increasing the HfO2 seeding layer with only 2 monolayers, the overlying ZrO2 layer
Externí odkaz:
https://doaj.org/article/4a9d880dba7a4de183fca65742d111e4
Publikováno v:
Advanced Materials Interfaces, Vol 10, Iss 21, Pp n/a-n/a (2023)
Abstract This paper describes a study where an argon cold plasma jet, generated by a dielectric‐barrier discharge (DBD), is combined with nanosecond laser ablation (248 nm, 25 ns, 10 Hz) to deposit silver particle aerosols onto the substrate at atm
Externí odkaz:
https://doaj.org/article/4a712b77088f4d75b35ec1c6bf1eed1e
Autor:
Shinichi Ogawa
Publikováno v:
AAPPS Bulletin, Vol 32, Iss 1, Pp 1-12 (2022)
Abstract This review introduces the technique of helium ion microscopy along with some unique applications of this technology in the fields of electronics and biology, as performed at the National Institute of Advanced Industrial Science and Technolo
Externí odkaz:
https://doaj.org/article/469b6f7ee895419098666ae2dcd71484
Autor:
Chaturanga D. Bandara, Matthias Schmidt, Yalda Davoudpour, Hryhoriy Stryhanyuk, Hans H. Richnow, Niculina Musat
Publikováno v:
Frontiers in Plant Science, Vol 13 (2023)
Externí odkaz:
https://doaj.org/article/fc42c1761df448e49de4d1d28490665a
Akademický článek
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Autor:
Natalie Frese, Patrick Schmerer, Martin Wortmann, Matthias Schürmann, Matthias König, Michael Westphal, Friedemann Weber, Holger Sudhoff, Armin Gölzhäuser
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 172-179 (2021)
Helium ion microscopy (HIM) offers the opportunity to obtain direct views of biological samples such as cellular structures, virus particles, and microbial interactions. Imaging with the HIM combines sub-nanometer resolution, large depth of field, an
Externí odkaz:
https://doaj.org/article/cbee723c30b247c48536f9d7fdda7bfb
Autor:
Daniel Emmrich, Annalena Wolff, Nikolaus Meyerbröker, Jörg K. N. Lindner, André Beyer, Armin Gölzhäuser
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 222-231 (2021)
A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be
Externí odkaz:
https://doaj.org/article/eb7e31f8c6a54785a545da6684dd3cb4
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 1-23 (2021)
Scanning helium-ion microscopy (HIM) is an imaging technique with sub-nanometre resolution and is a powerful tool to resolve some of the tiniest structures in biology. In many aspects, the HIM resembles a field-emission scanning electron microscope (
Externí odkaz:
https://doaj.org/article/3316b0d0fbf24e30852c04e8f003a286