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Autor:
Holovský, Jakub
This work concerns with today's challenges of photoelectrical characterization methods in the research and development of thin film silicon solar cells. Relevant results are obtained only when photocurrent spectroscopy and measurement of current-volt
Externí odkaz:
http://www.nusl.cz/ntk/nusl-312189
Autor:
Holovský, Jakub
This work concerns with today's challenges of photoelectrical characterization methods in the research and development of thin film silicon solar cells. Relevant results are obtained only when photocurrent spectroscopy and measurement of current-volt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::28c2cf5255f8645e474eb3b7aeb9d6d9
http://www.nusl.cz/ntk/nusl-312189
http://www.nusl.cz/ntk/nusl-312189