Two-dimensional measurements of the ELM filament using a multi-channel electrical probe array with high time resolution at the far SOL region in the KSTAR

Autor: Young-Hun Hong, Kwan-Yong Kim, Ju-Ho Kim, Soo-Hyun Son, Hyung-Ho Lee, Hyun-Dong Eo, Min-Seok Kim, Suk-Ho Hong, Chin-Wook Chung

Publikováno v: Nuclear Engineering and Technology, Vol 54, Iss 10, Pp 3717-3723 (2022)

For the first time, two-dimensional temporal behavior of the edge localized mode (ELM) filament is measured in the edge tokamak plasma with a multi-channel electrical probe array (MCEP). MCEP, which has 16 floating probes (4 × 4), is mounted at the

Externí odkaz: https://doaj.org/article/26d17cc3f6b74c76b1f03d6f5a3d07d3

Back current shunts for electrical diagnostic of Nanosecond Pulsed Discharges

Autor: Quercetti S., Martini L.M., Tosi P.

Publikováno v: FLTPD XIV-Frontiers in Low Temperature Plasma Diagnostics, Levico Terme, Italy, 1-5 May 2022
info:cnr-pdr/source/autori:Quercetti S.; Martini L.M.; Tosi P./congresso_nome:FLTPD XIV-Frontiers in Low Temperature Plasma Diagnostics/congresso_luogo:Levico Terme, Italy/congresso_data:1-5 May 2022/anno:2022/pagina_da:/pagina_a:/intervallo_pagine

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=cnr_________::b3136bff2fa752d4f51d651fd49f4c0b
http://www.cnr.it/prodotto/i/467327

Inference of X-Ray Emission from a Plasma Focus Discharge: Comparison between Characteristic Parameters and Neural Network Analyses

Autor: Sergio Davis, Gonzalo Avaria, Jorge Alfredo Ardila-Rey, Roger Schurch, Luis Orellana, Cristian Pavez

Publikováno v: IEEE Access, Vol 8, Pp 79273-79286 (2020)

Indexación: Scopus. Pulsed plasma discharges, such as the plasma focus, are a source of pulsed X rays, therefore it is desirable to understand the relationship between this fast transient phenomena and the electrical variables of the discharge. Para

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7006da8f570f3602cf71f5fee3d5d5ed
http://repositorio.unab.cl/xmlui/handle/ria/20275

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