Zobrazeno 1 - 6
of 6
pro vyhledávání: '"edge brightening"'
Autor:
Aaron Angel Salas-Sanchez, Paolo Rocca, Juan Antonio Rodriguez-Gonzalez, M. Elena Lopez-Martin, Francisco J. Ares-Pena
Publikováno v:
IEEE Access, Vol 8, Pp 184004-184012 (2020)
Implications and improvements of edge brightening effects led by Q factor minimization restricted to keep the same level of directivity for high efficiency continuous circular aperture distributions are here reported. In this manner, an optimization
Externí odkaz:
https://doaj.org/article/6ac2858611dd4078be7b91e50f0e3f29
Autor:
Salas Sánchez, Aarón Ángel, Rodríguez González, Juan Antonio, López Martín, María Elena, Rocca, Paolo, Ares Pena, Francisco José
Publikováno v:
Minerva: Repositorio Institucional de la Universidad de Santiago de Compostela
Universidad de Santiago de Compostela (USC)
Minerva. Repositorio Institucional de la Universidad de Santiago de Compostela
instname
IEEE Access, Vol 8, Pp 184004-184012 (2020)
Universidad de Santiago de Compostela (USC)
Minerva. Repositorio Institucional de la Universidad de Santiago de Compostela
instname
IEEE Access, Vol 8, Pp 184004-184012 (2020)
Implications and improvements of edge brightening effects led by $Q$ factor minimization restricted to keep the same level of directivity for high efficiency continuous circular aperture distributions are here reported. In this manner, an optimizatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63def9e25cbcfe5f6021bbad2c8b4a42
https://hdl.handle.net/10347/26772
https://hdl.handle.net/10347/26772
Conference
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Akademický článek
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Autor:
Hasselbach, F., Maier, U.
Publikováno v:
Scanning Microscopy
The interaction volume of the electron beam with the specimen in a scanning electron microscope (SEM) is a highly complex function of the surface structure of the specimen, its chemical composition and the energy of the scanning electron beam.· The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::d9d0c0feafd0d51e55f33533e93c57a2
https://digitalcommons.usu.edu/microscopy/vol1993/iss7/3
https://digitalcommons.usu.edu/microscopy/vol1993/iss7/3
Autor:
Hasselbach, Franz
Publikováno v:
Scanning Microscopy
In scanning microscopy in transmission (STEM) and reflection (SEM) the spreading of the spatial distributions of the forward-and backscattered electrons, respectively, deteriorates contrast and resolution. We therefore investigate this spreading by m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::201c01a989b6cbf84be4b3db868247d6
https://digitalcommons.usu.edu/context/microscopy/article/1277/viewcontent/WDCcenterscan1988Hasselbach_EmissionMicroscopeValuable.pdf
https://digitalcommons.usu.edu/context/microscopy/article/1277/viewcontent/WDCcenterscan1988Hasselbach_EmissionMicroscopeValuable.pdf