Výsledky vyhledávání - "dotted-I interconnect trees"

Akademický článek

Reliability of Multi-Terminal Copper Dual-Damascene Interconnect Trees

Autor: Gan, C.L., Thompson, Carl V., Pey, Kin Leong, Choi, Wee Kiong

Electromigration tests on different Cu dual-damascene interconnect tree structures consisting of various numbers of straight via-to-via lines connected at the common middle terminal have been carried out. Like Al-based interconnects, the reliability

Externí odkaz: http://hdl.handle.net/1721.1/3730

Zobrazit plný text záznamu

Akademický článek

Experimental characterization and modeling of the reliability of three-terminal dual-damascene Cu interconnect trees.

Autor: Gan, C. L., Thompson, C. V., Pey, K. L., Choi, W. K.

Publikováno v: Journal of Applied Physics; 7/15/2003, Vol. 94 Issue 2, p1222, 7p, 1 Black and White Photograph, 2 Diagrams, 2 Charts, 3 Graphs, 1 Map

Zobrazit plný text záznamu

Conference

Experimental Characterization of the Reliability of Multi-Terminal Dual-Damascene Copper Interconnect Trees.

Autor: Gan, C. L., Thompson, C. V., Pey, K. L., Choi, W. K., Chang, C. W., Guo, Q.

Publikováno v: MRS Online Proceedings Library; 2003, Vol. 766 Issue 1, p1-6, 6p

Zobrazit plný text záznamu

Conference

Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees.

Autor: Gan, C. L., Thompson, C. V., Pey, K. L., Choi, W. K., Wei, F., Yu, B., Hau-Riege, S. P.

Publikováno v: MRS Online Proceedings Library; 2002, Vol. 716 Issue 1, p1-6, 6p

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání