TRATAMENTO VÍDEO LAPAROSCÓPICO DE PERFURAÇÃO INTESTINAL

Autor: Gontscharow S, Benjamin do Carmo Lc, Barretto Ferreira da Silva Ar, Ibiapina Alves T

Publikováno v: Journal of Coloproctology. 39:244

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7bba183bce7c73a0e154d36eb4dab5c8
https://doi.org/10.1016/j.jcol.2019.11.467

Raman and infrared studies of theCN−stretching-mode anharmonicity and its relation to phase transitions in pure alkali cyanides

Autor: Durand D, Scavarda do Carmo Lc, Fritz Lüty

Publikováno v: Physical Review B. 39:6096-6110

A comprehensive ir and Raman study of the fundamental and overtone stretching modes of ${\mathrm{CN}}^{\mathrm{\ensuremath{-}}}$ molecules in pure alkali cyanides has been performed. Peak position, half-width, and strength of these modes have been me

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8920d93d9c5623095f603301921e4ef9
https://doi.org/10.1103/physrevb.39.6096

Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment

Autor: M.H.P. Mauricio, J. A. M. Pereira, Marco Cremona, Fabrizia Somma, L. C. Scavarda Do Carmo

Publikováno v: Scopus-Elsevier

Beams of 2.0 MeV nitrogen ions, produced by a Van de Graaff generator, were used in order to create point defects in polycrystalline LiF thin films. The radiation effects were examined by optical absorption, RES, PDMS and XPS methods. The concentrati

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::11dbaf155214d33b8385aff0ed48f7b9
https://hdl.handle.net/11590/119688

Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data.

Autor: Cremona M; Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marques São Vicente 225, 22453-900, Rio de Janeiro, Brazil; Centro Brasileiro de Pesquisas Físicas, Rua Dr Xavier Sigaud 150, 22290-180, Rio de Janeiro, Brazil; Departamento de Informática, Universidade Iguaçu/FaCET, Av. Abilio Augusto Tavora 2134, Nova Iguaçu, Rio de Janeiro, Brazil., Mauricio MH, Scavarda Do Carmo LC, Prioli R, Nunes VB, Zanette SI, Caride AO, Albuquerque MP

Publikováno v: Journal of microscopy [J Microsc] 2000 Mar; Vol. 197 (3), pp. 260-267.