Zobrazeno 1 - 1
of 1
pro vyhledávání: '"depth profiling, thermal annealing"'
Publikováno v:
Microchim. Acta 139 (2002) 11-16
For investigation of luminescent center profile cathodoluminescence measurements are used under variation of the primary electron energy Eo = 2..30 keV. Applying a constant incident power regime (Eo x Io = const), the depth profiles of luminescent ce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4577::26b2c6425ebf20a730bcde663526e753
https://www.hzdr.de/publications/Publ-5067-1
https://www.hzdr.de/publications/Publ-5067-1
