Výsledky vyhledávání - "de Ridder, René M"

Intra-laser-cavity microparticle sensing with a dual-wavelength distributed-feedback laser

Autor: Bernhardi, Edward H., van der Werf, Kees O, Hollink, Anton J F, Wörhoff, Kerstin, de Ridder, René M, Subramaniam, Vinod, Pollnau, Markus

Publikováno v: Bernhardi, E H, van der Werf, K O, Hollink, A J F, Wörhoff, K, de Ridder, R M, Subramaniam, V & Pollnau, M 2013, ' Intra-laser-cavity microparticle sensing with a dual-wavelength distributed-feedback laser ', Laser and Photonics Reviews, vol. 7, no. 4, pp. 589-598 . https://doi.org/10.1002/lpor.201200111

An integrated intra-laser-cavity microparticle sensor based on a dual-wavelength distributed-feedback channel waveguide laser in ytterbium-doped amorphous aluminum oxide on a silicon substrate is demonstrated. Real-time detection and accurate size me

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::af83fd3039f02eb681edf86c4e27ec71
http://www.scopus.com/inward/record.url?scp=84880109263&partnerID=8YFLogxK

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Focused ion beam nano-structuring of Bragg gratings in Al2O3 channel waveguides

Autor: Ay, Feridun, Uranga, Amaia, Bradley, Jonathan D.B., Worhoff, Kerstin, de Ridder, René M., Pollnau, Markus, de Ridder, René M, Kauppinen, Lasse J.

Publikováno v: Proceedings of the First International Workshop on FIB for Photonics: Collocated with the 14th European Conference on Integrated Optics (ECIO 2008), Eindhoven, the Netherlands, 13-14 June 2008, 48-50
STARTPAGE=48;ENDPAGE=50;TITLE=Proceedings of the First International Workshop on FIB for Photonics

We report our recent results on an optimization study of focused ion beam (FIB) nano-structuring of Bragg gratings in $Al_2O_3$ channel waveguides. By optimizing FIB milling parameters such as ion current, dwell time, loop repetitions, scanning strat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::dc5e9a99820f169cf4411683976c3ed1
https://research.utwente.nl/en/publications/focused-ion-beam-nanostructuring-of-bragg-gratings-in-al2o3-channel-waveguides(42a4af78-1f92-4d36-a895-79c4c8062c4f).html

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Akademický článek

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Focused ion beam milling strategy for sub-micrometre holes in silicon

Autor: Hopman, Wico C.L., Ay, Feridun, de Ridder, René M., Kauppinen, Lasse J.

Publikováno v: Proceedings of the First International Workshop on FIB for Photonics: Collocated with the 14th European Conference on Integrated Optics (ECIO 2008), Eindhoven, the Netherlands,13-14 June 2008, 12-15
STARTPAGE=12;ENDPAGE=15;TITLE=Proceedings of the First International Workshop on FIB for Photonics

Focused ion beam (FIB) milling can be used as a tool to fabricate structures with sub-micrometer details. The slab material can be silicon, for example, which can then be used as a mould for nano-imprint lithography, or in silicon on insulator (SOI)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::ed544079bcca396f4a318abf9cb2e526
https://research.utwente.nl/en/publications/focused-ion-beam-milling-strategy-for-submicrometre-holes-in-silicon(29540c4c-8a93-4c68-8f42-859a6e94aa7a).html

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Proceedings of the First International Workshop on FIB for Photonics : Eindhoven, the Netherlands, 13-14 June 2008: collocated with the 14th European Conference on Integrated Optics (ECIO 2008)

Autor: de Ridder, René M., Ay, Feridun, Kauppinen, Lasse J.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::408d085befb6af818fb25f9b6acb15c1
https://research.utwente.nl/en/publications/proceedings-of-the-first-international-workshop-on-fib-for-photonics--eindhoven-the-netherlands-1314-june-2008(4873b9cb-df52-48b7-8a34-6cf532b83726).html

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Focused ion beam milling of three dimensional nanostructures with high precision

Autor: Tjerkstra, R.W., Segerink, F.B., Kelly, J.J., Vos, W.L., de Ridder, René M., Ay, Feridun, Kauppinen, Lasse J.

Publikováno v: Proceedings of the First International Workshop on FIB for Photonics: Collocated with the 14th European Conference on Integrated Optics (ECIO 2008), Eindhoven, the Netherlands, 13-14 June 2008, 42-45
STARTPAGE=42;ENDPAGE=45;TITLE=Proceedings of the First International Workshop on FIB for Photonics

The fabrication of an extended three-dimensional nanostructure with dimensions much larger than the feature size using a focused ion beam is described. By milling two identical patterns of pores with a designed diameter of 460 nm in orthogonal direct

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::db9dcd83bf816ab10be113852e8ed3f7
https://research.utwente.nl/en/publications/focused-ion-beam-milling-of-three-dimensional-nanostructures-with-high-precision(ff7d30ea-95dd-4a07-9d4c-5d90a19d0c91).html

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Akademický článek

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Education and training in Integrated Optics at the University of Twente

Autor: de Ridder, René M., Lambeck, Paul V., Hoekstra, Hugo J.W.M., Driessen, Alfred, Velzel, Christiaan H.F.

Publikováno v: Fifth International Topical Meeting on Education and Training in Optics, 329-336
STARTPAGE=329;ENDPAGE=336;TITLE=Fifth International Topical Meeting on Education and Training in Optics

The curriculum in Electrical Engineering at the University of Twente has been recently adjusted in order to increase the proficiency in optics of the graduates, providing a general background and preparing especially for integrated optics and optical

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::974a6685b6433ab98634a9b6d13e6a12
https://research.utwente.nl/en/publications/084c434e-3f89-4f1e-bfcd-37584be06d02

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