Use of the Schiller decapitation process for the manufacture of high quality tungsten scanning tunneling microscopy tips.

Autor: de Raad, G. J., Koenraad, P. M., Wolter, J. H.

Publikováno v: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1999, Vol. 17 Issue 5, p1946-1953, 8p