Microstructural characterization of surface damage through ultra-short laser pulses

Autor: Ocelik, V., Vincenc Obona, J., Skolski, J.Z.P., Römer, Gerardus Richardus, Bernardus, Engelina, Huis in 't Veld, Bert, de De Hosson, J.Th.M.

Publikováno v: Proceedings of the 33rd International Congress on Applications of Lasers & Electro-Optics (ICALEO): San Diego, 19-23 October 2014
Proceedings of the 33rd International Congress on Applications of Lasers & Electro-Optics (ICALEO)

Electron back-scatter diffraction (EBSD) technique, commonly used to study the microstructural characteristics of materials, was employed for the investigation of the surface damage induced through ultra-short laser pulses. Single-crystal silicon sur

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::ac42471794e582bec27d481ef01110e3
https://research.utwente.nl/en/publications/microstructural-characterization-of-surface-damage-through-ultrashort-laser-pulses(1a01ae61-f8d1-4abe-8b8b-453ef7a11b8c).html