Zobrazeno 1 - 1
of 1
pro vyhledávání: '"désordre Al-Si"'
Autor:
Jacques Paquet, Alain Lefebvre
Publikováno v:
Périodiques Scientifiques en Édition Électronique.
c dissociated dislocations with variable dissociation widths (from 300 Å to a few microns) are systematically found in sillimanite studied by transmission electron microscopy. The corresponding stacking faults (with displacement vector 1/2 [001]) on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::142194cac0271af0c5c91d208f34ce99
https://www.persee.fr/doc/bulmi_0180-9210_1983_num_106_3_7707
https://www.persee.fr/doc/bulmi_0180-9210_1983_num_106_3_7707
